메뉴 건너뛰기




Volumn 98-99, Issue , 1999, Pages 139-148

The interaction between vapor-deposited Al atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy

Author keywords

Infrared; Metal deposition; Monolayer; Overlayer; Time of flight

Indexed keywords


EID: 0006678602     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00283-7     Document Type: Article
Times cited : (28)

References (47)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.