Determination of the von Klitzing constant and the fine-structure constant through a comparison of the quantized Hall resistance and the ohm derived from the NIST calculable capacitor

Metrologia

Volumn 35, Issue 2, 1998, Pages 83-96

  Jeffery, A ^a   Elmquist, R E ^a   Shields, J Q ^a   Lee, L H ^a   Cage, M E ^a   Shields, S H ^a   Dziuba, R F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINE STRUCTURE CONSTANT; KLITZING CONSTANT;

CAPACITORS; HALL EFFECT; MAGNETIC MOMENTS; METRIC SYSTEM; STANDARDS;

ELECTRIC RESISTANCE MEASUREMENT;

EID: 0031650383     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/2/3     Document Type: Review

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