Quantum resistance standards with double 2DEG

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 555-558

  Bounouh, Alexandre ^a   Poirier, W ^a   Piquemal, F ^a   Genevès, Gérard ^a   Andre J P ^b  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

^b OMMIC   (France)

Author keywords

Cryogenic current comparator bridge; Double two dimensional electron gases (2DEGs); Quantum Hall resistance (QHR) standard; Semiconductor microstructures

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRON GAS; HALL EFFECT; HETEROJUNCTIONS; METALLORGANIC VAPOR PHASE EPITAXY; MULTILAYERS; QUANTUM THEORY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; STANDARDS;

QUANTUM HALL ARRAY RESISTANCE STANDARDS; QUANTUM HALL RESISTANCE; TWO DIMENSIONAL ELECTRON GAS;

ELECTRIC RESISTANCE MEASUREMENT;

EID: 0038236922     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.811655     Document Type: Article

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