AC longitudinal and contact resistance measurements of quantum Hall devices

Metrologia

Volumn 43, Issue 1, 2006, Pages 163-173

  Schurr, J ^a   Ahlers, F J ^a   Hein, G ^a   Melcher, J ^a   Pierz, K ^a   Overney, F ^b   Wood, B M ^c  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b Swiss Federal Office of Metrology   (Switzerland)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DC MACHINERY; ELECTRIC VARIABLES MEASUREMENT; EQUIVALENT CIRCUITS; HALL EFFECT; OPTICAL RESOLVING POWER; QUANTUM THEORY;

AC MEASUREMENT; CONTACT RESISTANCE; MEASUREMENT SYSTEMS;

ELECTRIC RESISTANCE;

EID: 31544473493     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/43/1/021     Document Type: Article

References (21)

1. Comparison BIPM.EM-K12 http://kcdb.bipm.org appendix B
2. Delahaye F and Jeckelmann B 2003 Metrologia 40 217-23
3. Melcher J, Warnecke P and Hanke R 1993 IEEE Trans. Instrum. Meas. 42 292-4
4. Chua S W, Hartland A and Kibble B P 1999 IEEE Trans. Instrum. Meas. 48 309-13
5. Delahaye F 1994/95 Metrologia 31 367-73
6. Wood B M, Inglis A D and Cote M 1997 IEEE Trans. Instrum. Meas. 46 269-72
7. Schurr J, Melcher J, von Campenhausen A, Hein G, Ahlers F-J and Pierz K 2002 Metrologia 39 3-12
8. Overney F, Jeanneret B and Jeckelmann B 2003 IEEE Trans. Instrum. Meas. 52 574-8
9. Overney F, Jeanneret B, Wood B M and Schurr J 2005 IEEE Trans. Instrum. Meas. 54 658-61
10. Piquemal F P M, Trapon G R and Geneves G P J 1996 IEEE Trans. Instrum. Meas. 45 918-22
11. Cabiati F, Callegaro L, D'Elia V and Reedtz G M 1999 IEEE Trans. Instrum. Meas. 48 314-18
12. Ricketts B W and Kemeny P C 1988 J. Phys. D: Appl. Phys. 21 483-7
13. Delahaye F 1993 J. Appl. Phys. 73 7914-20
14. Ebert G, von Klitzing K and Weimann G 1985 J. Phys. C: Solid State Phys. 18 L257-60
15. Pruisken A M M 1988 Phys. Rev. Lett. 61 1297-300
16. Wei H P, Tsui D C, Paalanen M A and Pruisken A M M 1988 Phys. Rev. Lett. 61 1294-6
17. Dietsche W, von Klitzing K and Ploog K 1996 Surf. Sci. 361/362 289-92
18. Yahel E, Tsukernik A, Palevski A and Shtrikman H 1998 Phys. Rev. Lett. 81 5201-4
19. Delahaye F, Kibble B P and Zarka A 2000 Metrologia 37 659-70
20. Chklovskii D B, Shklovskii B I and Glazmann L I 1992 Phys. Rev. B 46 4026-34
21. Siddiki A and Gerhardts R R 2004 Phys. Rev. B 70 195335