Revised technical guidelines for reliable dc measurements of the quantized Hall resistance

Metrologia

Volumn 40, Issue 5, 2003, Pages 217-223

  Delahaye, F ^a   Jeckelmann, B ^b  

^a PAVILLON DE BRETEUIL   (France)

^b SFOMA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; HALL EFFECT; HETEROJUNCTIONS; MOSFET DEVICES; QUANTUM THEORY; SEMICONDUCTOR DEVICE STRUCTURES; STANDARDS;

HALL RESISTANCE; QUANTUM HALL EFFECT; VOLTAGE DROP;

ELECTRIC RESISTANCE MEASUREMENT;

EID: 0242336368     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/5/302     Document Type: Article

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