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European Physical Journal: Special Topics

Volumn 172, Issue 1, 2009, Pages 181-206

Application of the Josephson effect in electrical metrology

(2) Jeanneret, Blaise a Benz, S P b

a Swiss Federal Office of Metrology (Switzerland)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650539035 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2009-01050-6 Document Type: Review

Times cited : (116)

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