Phenomenological model for frequency-related dissipation in the quantized Hall resistance

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 2, 2007, Pages 431-434

  Jeanneret, Blaise ^a   Overney, Frédéric ^a  

^a Swiss Federal Office of Metrology   (Switzerland)

Author keywords

AC quantum Hall effect (QHE); AC resistance; Dielectric losses; Dissipation; Frequency dependence; Metrology

Indexed keywords

AC MACHINERY; DIELECTRIC LOSSES; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; ELECTRODYNAMICS; MATHEMATICAL MODELS;

AC QUANTUM HALL EFFECT; AC RESISTANCE; FREQUENCY DEPENDENCE; PHENOMENOLOGICAL MODEL;

HALL EFFECT;

EID: 34047213046     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.891162     Document Type: Conference Paper

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