Atomistic simulations of stress and microstructure evolution during polycrystalline Ni film growth

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 22, 2009, Pages

  Pao, Chun Wei ^a   Foiles, Stephen M ^b   Webb, Edmund B ^b   Srolovitz, David J ^c   Floro, Jerrold A ^d  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c YESHIVA UNIVERSITY   (United States)

^d University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650133091     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.224113     Document Type: Article

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