Numerical simulations of stress generation and evolution in Volmer-Weber thin films

Journal of the Mechanics and Physics of Solids

Volumn 56, Issue 8, 2008, Pages 2727-2747

  Tello, Juan S ^a   Bower, Allan F ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

Cohesive zone; Finite element analysis; Thin film stress; Volmer Weber growth

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; FILM GROWTH; FINITE ELEMENT METHOD; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES;

COHESIVE ZONE; THIN FILM STRESS; VOLMER-WEBER GROWTH;

THIN FILMS;

EID: 44649090609     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmps.2008.02.008     Document Type: Article

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