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Volumn 311, Issue 14, 2009, Pages 3573-3576

Misoriented domain formation in 6H-SiC single crystal

Author keywords

A1. Computer simulation; A1. Defects; A2. Single crystal growth; B2. Semiconducting materials

Indexed keywords

A1. COMPUTER SIMULATION; A1. DEFECTS; A2. SINGLE CRYSTAL GROWTH; AS-GROWN CRYSTAL; ATOMIC STRUCTURE; AXIAL GRADIENT; B2. SEMICONDUCTING MATERIALS; CRYSTAL PLANES; DOMAIN FORMATION; FORMATION MECHANISM; GROWTH FRONT; PHYSICAL VAPOR TRANSPORT; POLYTYPE; RAMAN SPECTRA; THERMAL INSULATORS;

EID: 67649861300     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.05.013     Document Type: Article
Times cited : (4)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.