Patterning of self-assembled monolayers based on differences in molecular conductance

Nanotechnology

Volumn 20, Issue 24, 2009, Pages

  Shen, Cai ^a   Buck, Manfred ^a  

^a UNIVERSITY OF ST ANDREWS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR CONDUCTANCE; SAMS; SCANNING PROBES; SCANNING TUNNELING MICROSCOPY (STM); SHEAR FORCE; STRUCTURAL QUALITIES;

MOLECULES; SCANNING; SCANNING TUNNELING MICROSCOPY;

SELF ASSEMBLED MONOLAYERS;

NANOMATERIAL; SELF ASSEMBLED MONOLAYER; THIOL DERIVATIVE;

ARTICLE; CHEMICAL STRUCTURE; CONDUCTANCE; MOLECULAR MECHANICS; MOLECULE; PHYSICAL PARAMETERS; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MICROSCOPY, SCANNING TUNNELING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES;

EID: 67649184584     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/24/245306     Document Type: Article

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