Scanning probe lithography. 4. Characterization of scanning tunneling microscope-induced patterns in n-alkanethiol self-assembled monolayers

Langmuir

Volumn 13, Issue 8, 1997, Pages 2323-2332

  Schoer, Jonathan K ^a   Crooks, Richard M ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001305862     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la960369v     Document Type: Article

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86. The Nanoscope software calculates the mean feature level in the roughness analysis feature by calculating the average of all the z values within a selected area relative to the z value of the tip when it engages the surface.
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