Nanoscale reversible molecular extraction from a self-assembled monolayer on gold(111) by a scanning tunneling microscope

Langmuir

Volumn 14, Issue 25, 1998, Pages 7197-7202

  Mizutani, Wataru ^a,c   Ishida, Takao ^b   Tokumoto, Hiroshi ^a,c  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b JRCAT   (Japan)

^c ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; GOLD; LANGMUIR BLODGETT FILMS; MOLECULAR DYNAMICS; ORGANIC COMPOUNDS; SCANNING TUNNELING MICROSCOPY; SOLVENT EXTRACTION; THRESHOLD VOLTAGE;

NANOSCALE REVERSIBLE MOLECULAR EXTRACTION; SELF ASSEMBLED MONOLAYER;

MONOLAYERS;

EID: 0032497877     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9804379     Document Type: Article

References (55)

1. (a) Binnig, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. Phys. Rev. Lett. 1983, 50, 120.
2. (b) Scanning Tunneling Microscopy; Stroscio, J. A., Kaiser, W. J., Eds.; Academic Press: San Diego, CA, 1993.
3. (c) Wiesendanger, R. Scanning Probe Microscopy and Spectroscopy - Methods and Applications; Cambridge University Press: Cambridge, 1994.
4. (a) Ulman, A. An Introduction to Ultrathin Organic Films from Langmuir-Blodgett to Self-Assembly; Academic Press: San Diego, CA, 1991.
5. (b) Ulman, A. Chem. Rev. 1996, 96, 1533.
6. Kumar, A.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1994, 10, 1498.
7. Kim, Y. Xia E.; Zhao, X.-M.; Rogers, J. A.; Pretiss, M.; Whitesides, G. M. Science 1996, 273, 347.
8. Xia, Y.; Whitesides, G. M. Langmuir 1997, 13, 2059.
9. Xia, Y.; Venkateswaran, N.; Qin, D.; Tien, J.; Whitesides, G. M. Langmuir 1998, 14, 363.
10. Sugimura, H.; Nakagiri, N.; Ichinose, N. Appl. Phys. Lett. 1995, 66, 3686.
11. Sugimura, H.; Nakagiri, N. J. Am. Chem. Soc. 1997, 119, 9226.
12. Sugimura, H.; Nakagiri, N. J. Vac. Sci. Technol., B 1997, 15, 1394.
13. Komeda, T.; Namba, K.; Nishioka, Y. Appl. Phys. Lett. 1997, 70, 3398.
14. Ohno, H.; Nagahara, L. A.; Gwo, S.; Mizutani, W.; Tokumoto, H. Jpn. J. Appl. Phys. 1996, 35, L512.
15. Ohno, H.; Nagahara, L. A.; Gwo, S.; Mizutani, W.; Tokumoto, H. Mol. Cryst. Liq. Cryst. 1997, 295, 189.
16. Stranick, S. J.; Parikh, A. N.; Tao, Y.-T.; Allara, D. L.; Weiss, P. S. J. Phys. Chem. 1994, 98, 7636.
17. Tamada, K.; Kara, M.; Sasabe, H.; Knoll, W. Langmuir 1997, 13, 1558.
18. Ishida, T.; Yamamoto, S.; Mizutani, W.; Motomatsu, M.; Tokumoto, H.; Hokari, H.; Azehara, H.; Fujihira, M. Langmuir 1997, 13, 3261.
19. Yamamoto, S.-I.; Ishida, T.; Mizutani, W.; Tokumoto, H.; Yamada, H. Jpn. J. Appl. Phys. 1997, 36, 3868.
20. Ishida, T.; Mizutani, W.; Tokumoto, H.; Hokari, H.; Azehara, H.; Fujihira, M. Appl. Surf. Sci. 1998, 130-132, 786.
21. Mizutani, W.; Ishida, T.; Yamamoto, S.-I.; Tokumoto, H.; Hokari, H.; Azehara, H.; Fujihira, M. Appl. Phys. A 1998, 66, S1257.
22. Eigler, D. M.; Schweizer, E. K. Nature 1990, 344, 524.
23. Cuberes, M. T.; Schlittler, R. R.; Gimzewski, J. K. Appl. Phys. Lett. 1996, 69, 3016.
24. Jung, T. A.; Schlittler, R. R.; Gimzewski, J. K.; Tang, H.; Joachim, C. Science 1996, 271, 181.
25. Kim, Y.-T.; Bard, A. J. Langmuir 1992, 8, 1096.
26. Dressick, W. J.; Calvert, J. M. Jpn. J. Appl. Phys. 1993, 32, 5829.
27. Lercel, M. L.; Redinbo, G. F.; Craighead, H. G. Appl. Phys. Lett. 1994, 65, 974.
28. Xu, S.; Liu, G.-Y. Langmuir 1997, 13, 127.
29. (a) Schoer, J. K.; Zamborini, F. P.; Crooks, R. M. J. Phys. Chem. 1996, 100, 11086.
30. (b) Schoer, J. K.; Crooks, R. M. Langmuir 1997, 13, 2323.
31. Schönenberger, C.; Sondag-Huethorst, J. A. M.; Jorritsma, J.; Fokkink, L. G. J. Langmuir 1994, 10, 611.
32. Delamarche, E.; Michel, B.; Gerber, Ch.; Anselmetti, D.; Güntherodt, H.-J.; Wolf, H.; Ringsdorf, H. Langmuir 1994, 10, 2869.
33. Poirier, G. E.; Tarlov, M. T. Langmuir 1994, 10, 2853.
34. Widrig, C. A.; Alves, C. A.; Porter, M. D. J. Am. Chem. Soc. 1991, 113, 2805.
35. Häussling, L.; Michel, B.; Ringsdorf, H.; Rohrer, H. Angew. Chem., Int. Ed. Engl. 1991, 30, 569.
36. Molecular lattice images with practically no defects were obtained by force microscopy by Alves and co-workers, but we think that the probe should touch the surface over a large area and detect only the periodicity of the surface in this case. (a) Alves, C. A.; Smith, E. L.; Porter, M. D. J. Am. Chem. Soc. 1992, 114, 1222.
37. (b) Alves, C. A.; Porter, M. D. Langmuir 1993, 9, 3507.
38. Nie, H.-Y.; Mizutani, W.; Tokumoto, H. Surf. Sci. 1994, 311, L649.
39. Mizutani, W.; Ohi, A.; Motomatsu, M.; Tokumoto, H. Jpn. J. Appl. Phys. 1995, 34, L1151.
40. 33,34 The disappearance of the reconstruction suggests the existence of weak adsorbates in UHV, which should be easily replaced by thiols.
41. Himmel, H.-J.; Wöll, Ch.; Gerlach, R.; Polanski, G.; Rubahn, H.-G. Langmuir 1997, 13, 602.
42. Kondoh, H.; Kodama, C.; Nozoye, H. J. Phys. Chem. 1998, B102, 2310.
43. Since the affected area can be reduced, this prior approach was often adopted for the atomic scale modification. (a) Lyo, I.-W.; Avouris, Ph. Science 1991, 253, 173.
44. (b) Hosoki, S.; Hosaka, S.; Hasegawa, T. Appl. Surf. Sci. 1992, 60/61, 643.
45. Poirier, G. E.; Pylant, E. D. Science 1996, 272, 1145.
46. 39 while the estimated thickness is about 0.7 nm.
47. Ohi, A.; Mizutani, W.; Tokumoto, H. J. Vac. Sci. Technol. 1995, B13, 1252.
48. Poirier, G. E.; Tarlov, M. T. J. Phys. Chem. 1995, 99, 10966.
49. Poirier, G. E. Langmuir 1997, 13, 2019.
50. Dishner, M. H.; Hemminger, J. C.; Feher, F. J. Langmuir 1997, 13, 2318.
51. Patten, P. G. Van; Noll, J. D.; Myrick, M. L. J. Phys. Chem. 1997, B101, 7874.
52. Schönenberger, C.; Jorritsma, J.; Sontag-Huethorst, J. A. M.; Fokkink, L. G. J. J. Phys. Chem. 1995, 99, 3259.
53. With STM, the depth of the hole with a lateral size comparable to the tip radius is measured smaller, when the tip apex cannot reach the bottom while the side of the tip senses the edge of the hole. This geometric artifact may be one of the reasons for the smaller measured depth than the measured film thickness.
54. Stroscio, J. A.; Eigler, D. M. Science 1991, 254, 1319.
55. Mo, Y. W. Phys. Rev. Lett. 1993, 71, 2923.