Electrically biased nanolithography with KOH-coated AFM tips

Nano Letters

Volumn 8, Issue 5, 2008, Pages 1451-1455

  Jang, Jae Won ^a   Sanedrin, Raymond G ^a   Maspoch, Daniel ^a,b   Hwang, Seongpil ^a   Fujigaya, Tsuyohiko ^a,c   Jeon, You Moon ^a   Vega, Rafael A ^a   Chen, Xiaodong ^a   Mirkin, Chad A ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY ICN2   (Spain)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; APPLIED BIAS; CONCENTRATION OF; END-FUNCTIONAL GROUPS; GOLD-COATED; HYDROXIDE ANIONS; PATTERN TOPOGRAPHIES; POINT OF CONTACTS; POTENTIAL CONTROLS; SAMS; SCANNING PROBES; SIGNIFICANT FACTORS; SILICON OXIDATIONS; SILICON SUBSTRATES; SUBSTRATE SURFACES; WATER MENISCUS;

ATOMIC FORCE MICROSCOPY; DESORPTION; ENGINEERING GEOLOGY; FUNCTIONAL GROUPS; SUBSTRATES; SURFACE TOPOGRAPHY;

PROCESS CONTROL;

HYDROXIDE; NANOMATERIAL; POTASSIUM DERIVATIVE; POTASSIUM HYDROXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTROMAGNETIC FIELD; ELECTROPLATING INDUSTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; TRANSDUCER; ULTRASTRUCTURE;

ELECTROMAGNETIC FIELDS; ELECTROPLATING; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; HYDROXIDES; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY; POTASSIUM COMPOUNDS; TRANSDUCERS;

EID: 46749129001     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl080418b     Document Type: Article

References (36)

1. Piner, R. D.; Zhu, J.; Xu, F.; Hong, S. H.; Mirkin, C. A. Science 1999, 283, 661-663.
2. Ginger, D. S.; Zhang, H.; Mirkin, C. A. Angew. Chem., Int. Ed. 2004, 43, 30-45.
3. Xu, S.; Miller, S.; Laibinis, P. E.; Liu, G.-Y. Langmuir 1999, 15, 7244-7251.
4. Amro, N. A.; Xu, S.; Liu, G.-Y. Langmuir 2000, 16, 3006-3009.
5. Liu, M.; Liu, G.-Y. Langmuir 2005, 21, 1972-1978.
6. Kim, Y. T.; Bard, A. J. Langmuir 1992, 8, 1096-1102.
7. Sugimura, H.; Hanji, T.; Hayashi, K.; Takai, O. Adv. Mater. 2002, 14, 524-526.
8. Ma, Y.-R.; Yu, C.; Yao, Y.-D.; Liou, Y.; Lee, S.-F. Phys. Rev. B 2001, 64, 195324.
9. Avouris, P.; Hertel, T.; Martel, R. Appl. Phys. Lett. 1997, 71, 285-287.
10. Dagata, J.; Schneir, J.; Harary, H. H.; Evans, C. J.; Postek, M. T.; Bennett, J. Appl. Phys. Lett. 1990, 56, 2001-2003.
11. Garcia, R.; Martinez, R. V.; Martinez, J. Chem. Soc. Rev. 2006, 35, 29-38.
12. Hoeppener, S.; Schubert, U. S. Small 2005, 1, 628-632.
13. Liu, X.; Fu, L.; Hong, S. H.; Dravid, V. P.; Mirkin, C. A. Adv. Mater. 2002, 14, 231-234.
14. Fresco, Z. M.; Frechet, J. M. J. J. Am. Chem. Soc. 2005, 127, 8302-8303.
15. Liu, S.; Maoz, R.; Sagiv, J. Nano Lett. 2004, 4, 845-851.
16. Vega, R. A.; Maspoch, D.; Salaita, K.; Mirkin, C. A. Angew. Chem., Int. Ed. 2005, 44, 6013-6015.
17. Rozhok, S.; Shen, C. K.-F.; Littler, P.-L. H.; Fan, Z.; Liu, C.; Mirkin, C. A.; Holz, R. C. Small 2005, 1, 445-451.
18. Lee, K.-B.; Park, S.-J.; Mirkin, C. A.; Smith, J. C.; Mrksich, M. Science 2002, 295, 1702-1705.
19. Zhang, H.; Mirkin, C. A. Chem. Mater. 2004, 16, 1480-1484.
20. Zhang, H.; Chung, S.-W.; Mirkin, C. A. Nano Lett. 2003, 5, 43-45.
21. Weinberger, D. A.; Hong, S.; Mirkin, C. A.; Wessels, B. W.; Higgins, T. B. Adv. Mater. 2000, 12, 1600-1603.
22. Jang, J.-W.; Maspoch, D.; Fujigaya, T.; Mirkin, C. A. Small 2007, 3, 600-605.
23. Schoer, J. K.; Crooks, R. M. Langmuir 1997, 13, 2323-2332.
24. Schoer, J. K.; Zamborini, F. P.; Crooks, R. M. J. Phys. Chem. 1996, 100, 11086-11091.
25. Hwang, J. S.; You, Z. Y.; Lin, S. Y.; Hu, Z. S.; Wu, C. T.; Chen, C. W.; Chen, K. H. Appl. Phys. Lett. 2005, 86, 161901.
26. Hoeppener, S.; van Schaik, J. H. K.; Schubert, U. S. Adv. Funct. Mater. 2006, 16, 76-82.
27. Wouters, D.; Willems, R.; Hoeppener, S.; Flipse, C. F. J.; Schubert, U. S. Adv. Funct. Mater. 2005, 15, 938-944.
28. Ara, M.; Graaf, H.; Tada, H. Appl. Phys. Lett. 2002, 80, 2565-2567.
29. Li, Q.; Zheng, J.; Liu, Z. Langmuir 2003, 19, 166-171.
30. Bloeb, H.; Staikov, G.; Schultze, J. W. Electrochim. Acta 2001, 47, 335-344.
31. Sugimura, H.; Uchida, T.; Kitamura, N.; Masuhara, H. J. Phys. Chem. 1994, 98, 4352-4357.
32. Piner, R. D.; Mirkin, C. A. Langmuir 1997, 13, 6864-6868.
33. Nagarajan, R. Langmuir 2002, 18, 31-38.
34. Fenter, P.; Eberhardt, A.; Liang, K. S.; Eisenberger, P. J. Chem. Phys. 1997, 106, 1600-1608.
35. Engelkes, V. B.; Beebe, J. M.; Frisbie, C. D. J. Am. Chem. Soc. 2004, 126, 14287-14296.
36. Rozhok, S.; Piner, R.; Mirkin, C. A. J. Phys. Chem. B 2003, 107, 751-757.