![]() |
Volumn 66, Issue SUPPL. 1, 1998, Pages
|
Surface charge mapping of solid surfaces in water by pulsed-force-mode atomic forcemicroscopy
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AFM;
AFM TIP;
ATOMIC FORCE MICROSCOPES;
ELECTRICAL DOUBLE LAYERS;
ELECTRODE POTENTIALS;
ISO-ELECTRIC POINTS;
LATERAL DISTRIBUTIONS;
LATERAL RESOLUTION;
OXIDE SAMPLES;
POINT OF ZERO CHARGE;
QUARTZ PLATES;
SAMPLE SURFACE;
SOLID SURFACE;
ATOMIC FORCE MICROSCOPY;
ELECTRIC PROPERTIES;
OXIDE MINERALS;
QUARTZ;
SILICON;
SURFACE CHARGE;
CHARGED PARTICLES;
|
EID: 24544446619
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051161 Document Type: Article |
Times cited : (33)
|
References (26)
|