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Volumn 66, Issue SUPPL. 1, 1998, Pages

Surface charge mapping of solid surfaces in water by pulsed-force-mode atomic forcemicroscopy

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM TIP; ATOMIC FORCE MICROSCOPES; ELECTRICAL DOUBLE LAYERS; ELECTRODE POTENTIALS; ISO-ELECTRIC POINTS; LATERAL DISTRIBUTIONS; LATERAL RESOLUTION; OXIDE SAMPLES; POINT OF ZERO CHARGE; QUARTZ PLATES; SAMPLE SURFACE; SOLID SURFACE;

EID: 24544446619     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051161     Document Type: Article
Times cited : (33)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.