Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe

Applied Physics Letters

Volumn 71, Issue 15, 1997, Pages 2061-2063

  Muramatsu, Hiroshi ^a   Chiba, Norio ^a   Fujihira, Masamichi ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; OPTICAL FIBERS; OPTICAL MICROSCOPY; PROBES; SCANNING; SCANNING TUNNELING MICROSCOPY;

FRICTIONAL IMAGING; SCANNING NEAR FIELD OPTICAL MICROSCOPES;

ATOMIC FORCE MICROSCOPY;

EID: 0031245203     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120446     Document Type: Article

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