Berkovich nanoindentation on InP

Journal of Alloys and Compounds

Volumn 482, Issue 1-2, 2009, Pages 498-501

  Jian, Sheng Rui ^a   Jang, Jason Shian Ching ^a  

^a I SHOU UNIVERSITY   (Taiwan)

Author keywords

Cross sectional transmission electron microscopy; Focused ion beam; InP; Micro Raman; Nanoindentation

Indexed keywords

BERKOVICH DIAMOND INDENTER; CRACKING PATTERNS; CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DEFORMATION MECHANISM; INDENTATION LOAD; INDUCED PHASE TRANSFORMATION; INP; LOAD-DISPLACEMENT CURVE; MECHANICAL DEFORMATION; MICRO RAMAN SPECTROSCOPY; MICRO-RAMAN; MICRO-RAMAN SPECTRA; NO PHASE; SAMPLE SURFACE; SEM; SLIP BAND; SLIP DEFORMATION;

DEFORMATION; DISLOCATIONS (CRYSTALS); ELECTRONS; FOCUSED ION BEAMS; MECHANISMS; NANOINDENTATION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VICKERS HARDNESS TESTING;

ELECTRON MICROSCOPES;

EID: 67349156711     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.04.052     Document Type: Article

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