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Volumn 404, Issue 14-15, 2009, Pages 1993-1997
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Temperature dependence of current-voltage characteristics of Al/p-Si (1 0 0) Schottky barrier diodes
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Author keywords
Barrier height; I V characteristics; Ideality factor; Metal semiconductor contact; Schottky barrier diode
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Indexed keywords
BARRIER HEIGHT;
BARRIER HEIGHTS;
CARRIER DENSITY;
CONTACT PROPERTIES;
I-V CHARACTERISTICS;
IDEALITY FACTOR;
IDEALITY FACTORS;
METAL-SEMICONDUCTOR CONTACT;
REVERSE-BIAS;
SERIES RESISTANCES;
SI(1 0 0);
TEMPERATURE DEPENDENCE OF CURRENT;
TEMPERATURE DEPENDENT;
TEMPERATURE RANGE;
ZERO-BIAS;
CARRIER CONCENTRATION;
CURRENT VOLTAGE CHARACTERISTICS;
DIODES;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DIODES;
THERMIONIC EMISSION;
SCHOTTKY BARRIER DIODES;
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EID: 67349156057
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2009.03.026 Document Type: Article |
Times cited : (52)
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References (28)
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