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Volumn 404, Issue 14-15, 2009, Pages 1993-1997

Temperature dependence of current-voltage characteristics of Al/p-Si (1 0 0) Schottky barrier diodes

Author keywords

Barrier height; I V characteristics; Ideality factor; Metal semiconductor contact; Schottky barrier diode

Indexed keywords

BARRIER HEIGHT; BARRIER HEIGHTS; CARRIER DENSITY; CONTACT PROPERTIES; I-V CHARACTERISTICS; IDEALITY FACTOR; IDEALITY FACTORS; METAL-SEMICONDUCTOR CONTACT; REVERSE-BIAS; SERIES RESISTANCES; SI(1 0 0); TEMPERATURE DEPENDENCE OF CURRENT; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; ZERO-BIAS;

EID: 67349156057     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.03.026     Document Type: Article
Times cited : (52)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.