Analysis of I-V measurements on Ag/p-SnS and Ag/p-SnSe Schottky barriers

Solid-State Electronics

Volumn 46, Issue 1, 2002, Pages 49-52

  Şafak, Haluk ^a   Şahin, Mehmet ^a   Faruk Yüksel, Ömer ^a  

^a SELCUK UNIVERSITY   (Turkey)

Author keywords

I V characteristics; IV VI layered semiconductor compounds; Schottky barriers

Indexed keywords

ANISOTROPY; CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; SCHOTTKY BARRIER DIODES; SILVER COMPOUNDS; SINGLE CRYSTALS;

DIODE IDEALITY FACTORS;

SEMICONDUCTOR DEVICES;

EID: 0036132406     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(01)00273-8     Document Type: Article

References (12)