How silylene defects at (100) Si surfaces can account for the anomalous features observed via x-ray photoelectron spectroscopy

Journal of Chemical Physics

Volumn 130, Issue 18, 2009, Pages

  Cerofolini, G F ^a   Giorgi, G ^b   Sgamellotti, A ^b   Belanzoni, P ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b UNIVERSITY OF PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIHYDRIDES; SI SURFACES; SILYLENE;

HYDROGEN; SILANES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67249159758     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3121282     Document Type: Article

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