Regular analog/RF integrated circuits design using optimization with recourse including ellipsoidal uncertainty

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 28, Issue 5, 2009, Pages 623-637

  Xu, Yang ^a   Hsiung, Kan Lin ^b   Li, Xin ^c   Pileggi, Lawrence T ^c   Boyd, Stephen P ^b  

^a Illinois Institute of Technology   (United States)

^b Stanford University   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Configurable design; Optimization with recourse; Robustness; Statistical optimization

Indexed keywords

ANALOG SYNTHESIS; APPLICATION SPECIFICS; CONFIGURABILITY; CONFIGURABLE DESIGN; DESIGN CYCLES; DESIGN METHODOLOGIES; DESIGN REUSE; GEOMETRIC PROGRAMMING; HIGH COSTS; IC TECHNOLOGIES; LAYOUT EXTRACTIONS; LOW NOISE AMPLIFIER DESIGNS; MASK LAYERS; MODELING ACCURACIES; NANO-SCALE; PROCESS PARAMETERS; PROCESS VARIABILITIES; REGULAR DESIGNS; RF OSCILLATORS; ROBUST DESIGNS; ROBUST OPTIMIZATIONS; ROBUSTNESS; STATISTICAL OPTIMIZATION; STATISTICAL VARIATIONS; SYNTHESIS PROBLEMS; TWO STAGES;

ANALOG CIRCUITS; APPLICATIONS; INTEGRATED CIRCUITS; LOW NOISE AMPLIFIERS; METAL RECOVERY; NANOSTRUCTURED MATERIALS; OPTIMIZATION; PRODUCT DEVELOPMENT; PROJECT MANAGEMENT;

DESIGN;

EID: 65349140030     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2009.2013996     Document Type: Article

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