The in situ characterization and structuring of electrografted polyphenylene films on silicon surfaces. An AFM and XPS study

Journal of Colloid and Interface Science

Volumn 328, Issue 2, 2008, Pages 308-313

  Ghorbal, Achraf ^a   Grisotto, Federico ^a   Laudé, Marion ^a   Charlier, Julienne ^a   Palacin, Serge ^a  

^a CEA SACLAY   (France)

Author keywords

AFM; Diazonium; Electrochemistry; Electrografting; Interface; Monolayer; Multilayer; Nanofriction; Patterning; Polyphenylene; Silicon oxide; Thin organic films; XPS

Indexed keywords

AFM; DIAZONIUM; ELECTROGRAFTING; NANOFRICTION; PATTERNING; POLYPHENYLENES; THIN ORGANIC FILMS;

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTROLYTIC ANALYSIS; FILM PREPARATION; INTERFACES (MATERIALS); MONOLAYERS; MULTILAYER FILMS; MULTILAYERS; OXIDE FILMS; SILICON; SILICON OXIDES; STRESSES; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYPHENYLENE OXIDES;

POLYMER; POLYPHENYLENE SULFIDE; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; ELECTROCHEMISTRY; SPECTROMETRY; SURFACE PROPERTY;

ELECTROCHEMISTRY; MICROSCOPY, ATOMIC FORCE; MOLECULAR STRUCTURE; POLYMERS; SILICON; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES;

EID: 64849107650     PISSN: 00219797     EISSN: 10957103     Source Type: Journal    
DOI: 10.1016/j.jcis.2008.09.033     Document Type: Article

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