Susceptibility of atomic force microscope cantilevers to lateral forces

Review of Scientific Instruments

Volumn 74, Issue 4, 2003, Pages 2438-2443

  Sader, John Elie ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; SPRINGS (COMPONENTS); TORQUE;

LATERAL FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 0038341801     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544421     Document Type: Article

References (11)

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3. T. R. Albrecht and C. F. Quate, J. Appl. Phys. 62, 2599 (1987).
4. T. R. Albrecht, S. Akamine, T. E. Carver, and C. F. Quate, J. Vac. Sci. Technol. A 8, 3386 (1990).
5. D. Sarid, Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford University Press, New York, 1994).
6. R. J. Roark and W. C. Young, Formulas for Stress and Strain (McGrawHill, New York, 1975).
7. J. M. Neumeister and W. A. Ducker, Rev. Sci. Instrum. 65, 2527 (1994).
8. J. E. Sader, Rev. Sci. Instrum. 66, 4583 (1995).
9. θ exhibit maximum errors of 5%, 1%. 4%, and 4%, respectively. The accuracy of all formulas improve as (L - ΔL)/c increases, and are exact in the limit as (L-ΔL)/c∞. The accuracy of Eq. (3) for V-shaped cantilevers was examined in Refs. 7 and 8.
10. E. Reissner and M. Stein, N.A.C.A. Technical Note No. 2369, June (1951)
11. J. E. Sader, in Encyclopedia of Surface and Colloid Science, edited by A. Hubbard (Marcel Dekker, New York, 2002), pp. 846-856.