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Volumn 9, Issue 1-2, 2000, Pages 77-87
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Quantitative elastic modulus measurement by magnetic force modulation microscopy
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Author keywords
Contact mechanics; Elastic modulus; Normal contact stiffness; Scanning force microscopy
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Indexed keywords
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EID: 0042971685
PISSN: 10238883
EISSN: None
Source Type: Journal
DOI: 10.1023/a:1018860528388 Document Type: Article |
Times cited : (13)
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References (36)
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