Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction

Zeitschrift fur Kristallographie, Supplement

Volumn , Issue 27, 2008, Pages 263-271

  Birkholz, M ^a   Darowski, N ^b   Zizak, I ^b  

^a IHP   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Texture; Texture gradient; Thin films; X ray diffraction

Indexed keywords

EID: 62749177495     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2008.0033     Document Type: Conference Paper

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