Modeling and parameter extraction for the series resistance in thin-film transistors

IEEE Transactions on Electron Devices

Volumn 56, Issue 3, 2009, Pages 431-440

  Jung, Keum Dong ^a   Kim, Yoo Chul ^a   Park, Byung Gook ^a   Shin, Hyungcheol ^a   Lee, Jong Duk ^a  

^a Seoul National University   (South Korea)

Author keywords

Channel length offset; Contact resistance; Modeling; Overlap length; Parasitic resistance; Series resistance; Thin film transistors (TFTs); Transfer length

Indexed keywords

AMORPHOUS SILICON; CONTACT RESISTANCE; PARAMETER EXTRACTION; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM DEVICES; TRANSISTORS;

CHANNEL LENGTH OFFSET; MODELING; OVERLAP LENGTH; PARASITIC RESISTANCE; SERIES RESISTANCE; THIN-FILM TRANSISTORS (TFTS); TRANSFER LENGTH;

THIN FILM TRANSISTORS;

EID: 62749085597     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2010579     Document Type: Article

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