Above-Threshold Parameter Extraction and Modeling for Amorphous Silicon Thin-Film Transistors

IEEE Transactions on Electron Devices

Volumn 50, Issue 11, 2003, Pages 2227-2235

  Servati, Peyman ^a   Striakhilev, Denis ^a   Nathan, Arokia ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Amorphous semiconductors; Contact resistance; Mobility; Parameter extraction; Thin film transistors (TFTs); Threshold voltage

Indexed keywords

AMORPHOUS SILICON; ELECTRIC RESISTANCE; HYDROGENATION; THRESHOLD VOLTAGE;

CONTACT RESISTANCES;

THIN FILM TRANSISTORS;

EID: 0242301137     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.818156     Document Type: Article

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