Polysilicon TFT technology for active matrix OLED displays

IEEE Transactions on Electron Devices

Volumn 48, Issue 5, 2001, Pages 845-851

  Stewart, Mark ^a   Howell, Robert S ^b   Pires, Leo ^b   Hatalis, Miltiadis K ^b  

^a NOKIA RESEARCH CENTER   (United States)

^b Lehigh University   (United States)

Author keywords

Hillocks; Nickel silicide; Organic light emitting diode displays; Polysilicon; Rapid thermal processing

Indexed keywords

DISPLAY DEVICES; ELECTRIC CONTACTS; ELECTRIC RESISTANCE; INDIUM COMPOUNDS; LIGHT EMITTING DIODES; MICROSTRUCTURE; ORGANIC COMPOUNDS; POLYSILICON; RAPID THERMAL ANNEALING;

DRAIN CURRENT; HILLOCKS; LOW RESISTANCE CONTACTS; ORGANIC LIGHT EMITTING DIODES DIPLAYS; UNIFORM BRIGHTNESS;

THIN FILM TRANSISTORS;

EID: 0035340341     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.918227     Document Type: Article

References (11)