Contrast and resolution of nanowires in electrostatic force microscopy

IEEE Transactions on Nanotechnology

Volumn 8, Issue 2, 2009, Pages 148-152

  Sacha, Gómez Moñivas ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Atomic force microscopy (AFM); Electrostatic forces; Nanowires

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERAMIC CAPACITORS; DIELECTRIC WAVEGUIDES; ELECTRIC WIRE; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; PERMITTIVITY;

ATOMIC FORCE MICROSCOPY (AFM); DIELECTRIC CONSTANTS; ELECTROSTATIC FORCE MICROSCOPIES; LATERAL RESOLUTIONS; METALLIC NANOWIRES; METALLIC OBJECTS; MUTUAL POLARIZATIONS; ORDER OF MAGNITUDES; THEORETICAL TECHNIQUES; TIP RADIUS;

NANOWIRES;

EID: 62449210353     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2008.2009356     Document Type: Article

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