-
1
-
-
1642324965
-
Properties of lead-free solder alloy with rare earth element additions
-
C.M.L. Wu, D.Q. Yu, C.M.T. Law, and L. Wang: Properties of lead-free solder alloy with rare earth element additions. Mater. Sci. Eng., R 44, 1 (2004).
-
(2004)
Mater. Sci. Eng., R
, vol.44
, pp. 1
-
-
Wu, C.M.L.1
Yu, D.Q.2
Law, C.M.T.3
Wang, L.4
-
2
-
-
20344388336
-
Interfacial reactions between lead-free solders and common base materials
-
T. Laurila, V. Vuorinen, and J.K. Kivilahti: Interfacial reactions between lead-free solders and common base materials. Mater. Sci. Rep. 49, 1 (2005).
-
(2005)
Mater. Sci. Rep
, vol.49
, pp. 1
-
-
Laurila, T.1
Vuorinen, V.2
Kivilahti, J.K.3
-
3
-
-
0035455514
-
Alloying effect in near-eutectic Sn-Ag-Cu solder alloys for improved microstructural stability
-
I.E. Anderson, J.C. Foley, B.A. Cook, J. Harringa, R.L. Terpstra, and O. Unal: Alloying effect in near-eutectic Sn-Ag-Cu solder alloys for improved microstructural stability. J. Electron. Mater. 30, 1050 (2001).
-
(2001)
J. Electron. Mater
, vol.30
, pp. 1050
-
-
Anderson, I.E.1
Foley, J.C.2
Cook, B.A.3
Harringa, J.4
Terpstra, R.L.5
Unal, O.6
-
4
-
-
0037444778
-
A study of Sn-Bi-Ag-(In) lead-free solder
-
L-W. Tsay, C-L. Lin, J-L. Ou, and R-K. Shiue: A study of Sn-Bi-Ag-(In) lead-free solder. J. Mater. Sci. 38, 1269 (2003).
-
(2003)
J. Mater. Sci
, vol.38
, pp. 1269
-
-
Tsay, L.-W.1
Lin, C.-L.2
Ou, J.-L.3
Shiue, R.-K.4
-
5
-
-
0036477480
-
Morphology, kinetics and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn-3.5Ag, Sn-3.8Ag-0.7Cu and Sn-0.7Cu) on Cu
-
T.Y. Lee, W.J. Choi, and K.N. Tu: Morphology, kinetics and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn-3.5Ag, Sn-3.8Ag-0.7Cu and Sn-0.7Cu) on Cu. J. Mater. Res. 17, 291 (2002).
-
(2002)
J. Mater. Res
, vol.17
, pp. 291
-
-
Lee, T.Y.1
Choi, W.J.2
Tu, K.N.3
-
6
-
-
33845594178
-
Effect of intermetallic and Kirkendall voids growth on board level drop reliability for SnAgCu lead-free solder BGA solder joint
-
San Diego, CA
-
L. Xu and J.H.L. Pang: Effect of intermetallic and Kirkendall voids growth on board level drop reliability for SnAgCu lead-free solder BGA solder joint, in Proc. 56th Electronic Component and Technology Conference (San Diego, CA, 2006), p. 275.
-
(2006)
Proc. 56th Electronic Component and Technology Conference
, pp. 275
-
-
Xu, L.1
Pang, J.H.L.2
-
7
-
-
0034293761
-
Effect of soldering and aging time on interfacial microstructure and growth of intermetallic compounds between Sn-3.5Ag solder alloy and Cu substrate
-
W.K. Choi and H.M. Lee: Effect of soldering and aging time on interfacial microstructure and growth of intermetallic compounds between Sn-3.5Ag solder alloy and Cu substrate. J. Electron. Mater. 29, 1207 (2000).
-
(2000)
J. Electron. Mater
, vol.29
, pp. 1207
-
-
Choi, W.K.1
Lee, H.M.2
-
8
-
-
0037076832
-
Six cases of reliability study of Pb-free solder joints in electronic packaging technology
-
K. Zeng and K.N. Tu: Six cases of reliability study of Pb-free solder joints in electronic packaging technology. Mater. Sci. Eng., R 38, 55 (2002).
-
(2002)
Mater. Sci. Eng., R
, vol.38
, pp. 55
-
-
Zeng, K.1
Tu, K.N.2
-
9
-
-
0038351737
-
3Sn plates in Sn-Ag-Cu alloys and optimization of their alloy composition
-
New Orleans, LA
-
3Sn plates in Sn-Ag-Cu alloys and optimization of their alloy composition, in Proc. 53rd Electronic Component on Technology Conference (New Orleans, LA, 2003), p. 64.
-
(2003)
Proc. 53rd Electronic Component on Technology Conference
, pp. 64
-
-
Kang, S.K.1
Choi, W.K.2
Shih, D.-Y.3
Henderson, D.W.4
Gosselin, T.5
Sarkhel, A.6
Goldsmith, C.7
Puttlitz, K.J.8
-
10
-
-
33645566980
-
Interfacial reactions of Sn-Ag-Cu solders modified by minor Zn alloying addition
-
S.K. Kang, D. Leonard, D-Y. Shih, L. Gignac, D.W. Henderson, S. Cho, and J. Yu: Interfacial reactions of Sn-Ag-Cu solders modified by minor Zn alloying addition. J. Electron. Mater. 35, 479 (2006).
-
(2006)
J. Electron. Mater
, vol.35
, pp. 479
-
-
Kang, S.K.1
Leonard, D.2
Shih, D.-Y.3
Gignac, L.4
Henderson, D.W.5
Cho, S.6
Yu, J.7
-
11
-
-
3242806751
-
3Sn plate formation in near-ternary-eutectic Sn-Ag-Cu solder by minor Zn alloying
-
3Sn plate formation in near-ternary-eutectic Sn-Ag-Cu solder by minor Zn alloying. JOM 56, 34 (2004).
-
(2004)
JOM
, vol.56
, pp. 34
-
-
Kang, S.K.1
Shih, D.-Y.2
Leonard, D.3
Henderson, D.W.4
Gosselin, T.5
Cho, S.6
Yu, J.7
Choi, W.K.8
-
12
-
-
21344462667
-
Improvement of microstructure and interface structure of eutectic Sn-0.7Cu solder with small amount Zn addition
-
F. Wang, X. Ma, and Y. Qian: Improvement of microstructure and interface structure of eutectic Sn-0.7Cu solder with small amount Zn addition. Scr. Mater. 53, 699 (2005).
-
(2005)
Scr. Mater
, vol.53
, pp. 699
-
-
Wang, F.1
Ma, X.2
Qian, Y.3
-
13
-
-
19944432174
-
Kirkendall void formation in eutectic Sn-Pb solder joint on bare Cu and its effect on joint reliability
-
K. Zeng, R. Stierman, T-C. Chiu, D. Edward, K. Ano, and K.N. Tu: Kirkendall void formation in eutectic Sn-Pb solder joint on bare Cu and its effect on joint reliability. J. Appl. Phys. 97, 024508 (2005).
-
(2005)
J. Appl. Phys
, vol.97
, pp. 024508
-
-
Zeng, K.1
Stierman, R.2
Chiu, T.-C.3
Edward, D.4
Ano, K.5
Tu, K.N.6
-
14
-
-
4944219736
-
Solid-state intermetallic compound layer growth between copper and 95.5Sn-3.9Ag-0.6Cu solder
-
P.T. Vianco, J.A. Rejent, and P.F. Hlava: Solid-state intermetallic compound layer growth between copper and 95.5Sn-3.9Ag-0.6Cu solder. J. Electron. Mater. 33, 991 (2004).
-
(2004)
J. Electron. Mater
, vol.33
, pp. 991
-
-
Vianco, P.T.1
Rejent, J.A.2
Hlava, P.F.3
-
15
-
-
33845562099
-
The influence of low level doping on the thermal evolution of SAC alloy solder joints with Cu pad structure
-
San Diego, CA
-
I. de Souas, D.W. Henderson, L. Patry, S.K. Kang, and D-Y. Shih: The influence of low level doping on the thermal evolution of SAC alloy solder joints with Cu pad structure, in Proc. 56th Electronic Component and Technology Conference (San Diego, CA, 2006), p. 1454.
-
(2006)
Proc. 56th Electronic Component and Technology Conference
, pp. 1454
-
-
de Souas, I.1
Henderson, D.W.2
Patry, L.3
Kang, S.K.4
Shih, D.-Y.5
-
16
-
-
3242808300
-
Sn-Ag-Cu and Sn-Cu solder: Interfacial reactions with platinum
-
T.H. Kim and Y-H. Kim: Sn-Ag-Cu and Sn-Cu solder: Interfacial reactions with platinum. JOM 56, 45 (2004).
-
(2004)
JOM
, vol.56
, pp. 45
-
-
Kim, T.H.1
Kim, Y.-H.2
-
17
-
-
61749103170
-
Intermetallic compound formation at the interface between Sn-3.OAg-0.5Cu solder alloy and Cu-Zn alloy substrate
-
Tokyo
-
W.K. Choi, Y.C. Sohn, C.Y. Moon, H.R. Roh, C.Y. Oh, and Y-H. Kim: Intermetallic compound formation at the interface between Sn-3.OAg-0.5Cu solder alloy and Cu-Zn alloy substrate, in Proc. 2007 International Conference on Electronic Packaging (Tokyo, 2007).
-
(2007)
Proc. 2007 International Conference on Electronic Packaging
-
-
Choi, W.K.1
Sohn, Y.C.2
Moon, C.Y.3
Roh, H.R.4
Oh, C.Y.5
Kim, Y.-H.6
-
18
-
-
0036502993
-
Electronic structure mechanism for the wettability of Sn-based solder alloys
-
W. Feng, C. Wang, and M. Morinaga: Electronic structure mechanism for the wettability of Sn-based solder alloys. J. Electron. Mater. 31, 185 (2002).
-
(2002)
J. Electron. Mater
, vol.31
, pp. 185
-
-
Feng, W.1
Wang, C.2
Morinaga, M.3
-
19
-
-
34547106589
-
Effect of Zn on the intermetallic formation and reliability of Sn-3.5Ag solder on a Cu pad
-
Y.K. Jee, Y-H. Ko, and J. Yu: Effect of Zn on the intermetallic formation and reliability of Sn-3.5Ag solder on a Cu pad. J. Mater. Res. 22(7), 1879 (2007).
-
(2007)
J. Mater. Res
, vol.22
, Issue.7
, pp. 1879
-
-
Jee, Y.K.1
Ko, Y.-H.2
Yu, J.3
-
20
-
-
84876909903
-
Formation and growth of intermetallic compounds at the interface between Pb-free solder and Cu-Zn UBM
-
San Jose, CA
-
C.Y. Oh, H.R. Roh, and Y-H. Kim: Formation and growth of intermetallic compounds at the interface between Pb-free solder and Cu-Zn UBM, in Proc. 40th International Microelectronic and Packaging Society (San Jose, CA, 2007), p. 48.
-
(2007)
Proc. 40th International Microelectronic and Packaging Society
, pp. 48
-
-
Oh, C.Y.1
Roh, H.R.2
Kim, Y.-H.3
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