Optical properties and microstructure of Ta2O5 biaxial film

Applied Optics

Volumn 48, Issue 1, 2009, Pages 127-133

  Qi, Hongji ^a,b   Xiao, Xiudi ^a   He, Hongbo ^a   Yi, Kui ^a   Fan, Zhengxiu ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b Shanghai Institution of Optics and Fine Mechanics   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DISPERSIONS; FILM THICKNESS; INVERSE PROBLEMS; MICROSTRUCTURE; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; TANTALUM OXIDES; THIN FILMS;

DEPOSITION TECHNIQUE; DISPERSION EQUATIONS; GLANCING ANGLE DEPOSITION; INVERSE SYNTHESIS; OPTICAL PROPERTIES OF THIN FILMS; PROPERTIES AND MICROSTRUCTURES; THEORETICAL CALCULATIONS; TRANSMITTANCE SPECTRA;

OPTICAL FILMS;

EID: 60849096673     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.000127     Document Type: Article

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