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Volumn 109, Issue 3, 2009, Pages 275-279

Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface

Author keywords

Atomic force microscope (AFM); Chlorite; Clinochlore; Frequency modulation; Torsional resonance

Indexed keywords

AFM; AMPLITUDE AND FREQUENCY MODULATIONS; ATOMIC FORCE MICROSCOPE (AFM); ATOMIC FORCES; BRUCITE; CHLORITE; CLINOCHLORE; CONSTANT AMPLITUDES; IMAGING CONDITIONS; IN PLANES; MINERAL SURFACES; SCANNING PROBES; SHEAR FORCES; SHEAR-FORCE MODES; SURFACE AREAS; TORSIONAL RESONANCE; TORSIONAL RESONANCE MODES;

EID: 59649108488     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.11.016     Document Type: Article
Times cited : (9)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.