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Volumn 109, Issue 3, 2009, Pages 275-279
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Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface
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Author keywords
Atomic force microscope (AFM); Chlorite; Clinochlore; Frequency modulation; Torsional resonance
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Indexed keywords
AFM;
AMPLITUDE AND FREQUENCY MODULATIONS;
ATOMIC FORCE MICROSCOPE (AFM);
ATOMIC FORCES;
BRUCITE;
CHLORITE;
CLINOCHLORE;
CONSTANT AMPLITUDES;
IMAGING CONDITIONS;
IN PLANES;
MINERAL SURFACES;
SCANNING PROBES;
SHEAR FORCES;
SHEAR-FORCE MODES;
SURFACE AREAS;
TORSIONAL RESONANCE;
TORSIONAL RESONANCE MODES;
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
ENERGY DISSIPATION;
FREQUENCY MODULATION;
MICROSCOPES;
MINERALOGY;
MINERALS;
RESONANCE;
SILICA;
SILICATE MINERALS;
SURFACE PROPERTIES;
MODULATION;
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EID: 59649108488
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2008.11.016 Document Type: Article |
Times cited : (9)
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References (37)
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