Influence of environmental conditions on shear-force distance control in near-field optical microscopy

Journal of Applied Physics

Volumn 86, Issue 12, 1999, Pages 7100-7106

  Brunner, R ^a   Marti, O ^a   Hollricher, O ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001433937     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371798     Document Type: Article

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