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Volumn 92, Issue 5, 2008, Pages

Torsional resonance atomic force microscopy in water

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE QUALITY; MAGNETOSTRICTIVE DEVICES; SAMPLING; TORSION TESTING;

EID: 38949118921     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2841701     Document Type: Article
Times cited : (25)

References (18)
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    • R. García and J. Tamayo, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.122632 73, 2926 (1998).
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    • R. García, R. Magerle, and R. Perez, Nat. Mater. NMAACR 1476-1122 10.1038/nmat1925 6, 405 (2007).
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    • García, R.1    Magerle, R.2    Perez, R.3
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    • Huang, L.1    Su, C.2
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    • Y. Song and B. Bhushan, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1876576 97, 083533 (2005).
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    • Song, Y.1    Bhushan, B.2
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    • JAPIAU 0021-8979 10.1063/1.373133.
    • T. A. Duenas and G. P. Carman, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.373133 87, 4696 (2000).
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    • Duenas, T.A.1    Carman, G.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.