On the nanoscale measurement of friction using atomic-force microscope cantilever torsional resonances

Applied Physics Letters

Volumn 82, Issue 16, 2003, Pages 2604-2606

  Reinstadtler M ^a   Rabe, U ^a   Scherer, V ^b   Hartmann, U ^a   Goldade, A ^c   Bhushan, B ^c   Arnold, W ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b Federal Mogul Holdings Deutschland GmbH   (Germany)

^c OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DAMPING; ENERGY DISSIPATION; NATURAL FREQUENCIES; PIEZOELECTRIC TRANSDUCERS; RESONANCE; SILICON;

CANTILEVER TORSIONAL RESONANCES;

FRICTION;

EID: 0038221380     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1565179     Document Type: Article

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