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Volumn 2, Issue 4, 2008, Pages 381-385

Influence of deposition temperature on the structure and optical properties of HfO2 thin films

Author keywords

Growth temperature; Hafnium oxide (HfO2); Refractive index; Structure; Texture

Indexed keywords


EID: 57849137292     PISSN: 16737377     EISSN: 16737482     Source Type: Journal    
DOI: 10.1007/s11706-008-0066-9     Document Type: Article
Times cited : (11)

References (17)
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    • Wilk, G.D.1    Wallace, R.M.2    Anthony, J.M.3
  • 2
    • 31044455312 scopus 로고    scopus 로고
    • High dielectric constant gate oxides for metal oxide Si transistors
    • 2
    • J. Robertson 2006 High dielectric constant gate oxides for metal oxide Si transistors Reports on Progress in Physics 69 2 327 396
    • (2006) Reports on Progress in Physics , vol.69 , pp. 327-396
    • Robertson, J.1
  • 4
    • 0037393375 scopus 로고    scopus 로고
    • Preparation of hafnium oxide thin film by electron beam evaporation of hafnium incorporating a post-thermal process
    • 1-4
    • S. Xing N. L. Zhang Z. T. Song 2003 Preparation of hafnium oxide thin film by electron beam evaporation of hafnium incorporating a post-thermal process Microelectronic Engineering 66 1-4 451 456
    • (2003) Microelectronic Engineering , vol.66 , pp. 451-456
    • Xing, S.1    Zhang, N.L.2    Song, Z.T.3
  • 13
    • 1842765687 scopus 로고    scopus 로고
    • Effect of deposition temperature on the characteristics of hafnium oxide films deposited by metalorganic chemical vapor deposition using amide precursor
    • 2
    • K. Takahashi H. Funakubo S. Hino 2004 Effect of deposition temperature on the characteristics of hafnium oxide films deposited by metalorganic chemical vapor deposition using amide precursor Journal of Materials Research 19 2 584 589
    • (2004) Journal of Materials Research , vol.19 , pp. 584-589
    • Takahashi, K.1    Funakubo, H.2    Hino, S.3
  • 15
    • 20144383101 scopus 로고    scopus 로고
    • Engineering structure and properties of hafnium oxide films by atomic layer deposition temperature
    • 1-2
    • K. Kukli J. Aarik T. Uustare 2005 Engineering structure and properties of hafnium oxide films by atomic layer deposition temperature Thin Solid Films 479 1-2 1 11
    • (2005) Thin Solid Films , vol.479 , pp. 1-11
    • Kukli, K.1    Aarik, J.2    Uustare, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.