Double patterning technology friendly detailed routing

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2008, Pages 506-511

  Cho, Minsik ^a   Ban, Yongchan ^a   Pan, David Z ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DECOMPOSABILITY; DESIGN FLOWS; DETAILED ROUTING; DOUBLE PATTERNING; LAYOUT DECOMPOSITIONS; MASS PRODUCTIONS; OVERLAY ERRORS; SPEED-UP; TECHNOLOGY NODES; WIRE LENGTHS;

COMPUTER AIDED DESIGN; TITRATION;

ROUTING ALGORITHMS;

EID: 57849085250     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2008.4681622     Document Type: Conference Paper

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