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Hyper-NA TWINSCAN systems for volume production at 45 nm and below
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Boom, H.6
van den Boom, E.-J.7
Kneer, B.8
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2
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35148872760
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Fluoroalcohol materials with tailored interfacial properties for immersion lithography
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Sanders, D. P., Sundberg, L. K., Sooriyakumaran, R., Brock, P. J., DiPietro, R. A., Truong, H. D., Miller, D. C., Lawson, M. C. and Allen, R. D., "Fluoroalcohol materials with tailored interfacial properties for immersion lithography," Proc. SPIE, 6519, 651904 (2007).
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Truong, H.D.6
Miller, D.C.7
Lawson, M.C.8
Allen, R.D.9
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3
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34648830588
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Topcoat-free photoresists for 193 nm immersion lithography
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Sanders, D. P., Sundberg, L. K., Sooriyakumaran, R. and Allen, R.D., "Topcoat-free photoresists for 193 nm immersion lithography," Microlithography World 16(3), 8-13 (2007).
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Sanders, D.P.1
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4
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34948852640
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Creating 193 nm immersion resists with embedded top barriers
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Sept
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Wang, D., Xu, C., Caporale, S. and Trefonas, P., "Creating 193 nm immersion resists with embedded top barriers," Solid State Technology 50-55, (Sept. 2007).
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Wang, D.1
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33745622556
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Immersion specific defect mechanisms: Findings and recommendations for their control
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6
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A deep dive into clear water: Immersion defect capabilities
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Streefkerk, B., Mulkens, J., Moerma, R., Stavenga, M., van der Hoeven, J., Grouwstra, C., Bruls, R., Leenders, M., Wang, S., van Dommelen, Y., Boerema, M., Jansen, H., Cummings, K., Riepen, M., Boom, H., Suddendorf, M. and Huisman, P., "A deep dive into clear water: immersion defect capabilities," Proc. SPIE, 6154, 61540S (2006).
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7
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33745610916
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The effect of photoresist/topcoat properties on defect formation in immersion lithography
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8
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Schuetter, S., Shedd, T., Doxtator, K., Van Peski, C., Grenville, A., Lin, S.-H. and Owe-Yang, D. C., Measurements of the dynamic contact angle for conditions relevant to immersion lithography, J. Microlith., Microfab., Microsys. 5(2), 023002 (Apr-Jun 2006).
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Schuetter, S., Shedd, T., Doxtator, K., Van Peski, C., Grenville, A., Lin, S.-H. and Owe-Yang, D. C., "Measurements of the dynamic contact angle for conditions relevant to immersion lithography," J. Microlith., Microfab., Microsys. 5(2), 023002 (Apr-Jun 2006).
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Design of protective topcoats for immersion lithography
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Allen, R. D., Brock, P. J., Sundberg, L., Larson, C. E., Wallraff, G. M., Hinsberg, W. D., Meute, J., Shimokawa, T., Chiba, T. and Slezak, M., "Design of protective topcoats for immersion lithography," J. Photopolym. Sci. Technol. 18(5), 615-619 (2005).
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35148817085
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Building an immersion top coat from the ground up - materials perspective
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11
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33644780102
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Second generation fluids for 193 nm immersion lithography
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French, R. H., Qiu, W., Yang, M. K., Wheland, R. C., Lemon, M. F., Shoe, A. L., Adelman, D. J., Crawford, M. K., Tran, H. V., Feldman, J., McLain, S. J. and Peng, S., "Second generation fluids for 193 nm immersion lithography," Proc. SPIE, 6154, 615415 (2006).
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13
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33745633889
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High-refractive-index fluids for the next generation ArF immersion lithography
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Wang, Y., Miyamatsu, T., Furukawa, T., Yamada, K., Tominaga, T., Makita, Y., Nakagawa, H., Nakamura, A., Shima, M., Kusumoto, S., Shimokawa, T. and Hieda, K., "High-refractive-index fluids for the next generation ArF immersion lithography," Proc. SPIE, 6153, 61530A (2006).
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15
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57549091604
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Oil or water: What's the difference for 193 nm immersion lithography?
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Prince Edward Island, Canada
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Sanders, D., Larson, C., Sundberg, L., Truong, H., Allen, R. and Goldfarb, D., "Oil or water: what's the difference for 193 nm immersion lithography?" IEEE Lithography Workshop, Prince Edward Island, Canada (2006).
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IEEE Lithography Workshop
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Oil or water: What's the difference for 193 nm immersion lithography?
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Kyoto, Japan
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Sanders, D., Larson, C., Sundberg, L., Truong, H., Allen, R. and Goldfarb, D., "Oil or water: what's the difference for 193 nm immersion lithography?" 3rd International Symposium on Immersion Lithography, Kyoto, Japan, (2006).
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Contact angles and liquid loss behavior of high index fluids
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New materials for surface energy control of 193 nm photoresists
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Keystone, Colorado, USA
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Sanders, D., Sundberg, L., Ito, H., Brock, P., Sooriyakumaran, R., Truong, H. and Allen, R., "New materials for surface energy control of 193 nm photoresists," 4th International Symposium on Immersion Lithography, Keystone, Colorado, USA (2007).
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4th International Symposium on Immersion Lithography
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Sanders, D.1
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