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Volumn 6923, Issue , 2008, Pages

Self-segregating materials for immersion lithography

Author keywords

Graded topcoat; High index immersion; Immersion lithography; Topcoat; Topcoat free photoresist

Indexed keywords


EID: 57349144370     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.772937     Document Type: Conference Paper
Times cited : (8)

References (18)
  • 4
    • 34948852640 scopus 로고    scopus 로고
    • Creating 193 nm immersion resists with embedded top barriers
    • Sept
    • Wang, D., Xu, C., Caporale, S. and Trefonas, P., "Creating 193 nm immersion resists with embedded top barriers," Solid State Technology 50-55, (Sept. 2007).
    • (2007) Solid State Technology , pp. 50-55
    • Wang, D.1    Xu, C.2    Caporale, S.3    Trefonas, P.4
  • 8
    • 33745804034 scopus 로고    scopus 로고
    • Schuetter, S., Shedd, T., Doxtator, K., Van Peski, C., Grenville, A., Lin, S.-H. and Owe-Yang, D. C., Measurements of the dynamic contact angle for conditions relevant to immersion lithography, J. Microlith., Microfab., Microsys. 5(2), 023002 (Apr-Jun 2006).
    • Schuetter, S., Shedd, T., Doxtator, K., Van Peski, C., Grenville, A., Lin, S.-H. and Owe-Yang, D. C., "Measurements of the dynamic contact angle for conditions relevant to immersion lithography," J. Microlith., Microfab., Microsys. 5(2), 023002 (Apr-Jun 2006).
  • 11
    • 33644780102 scopus 로고    scopus 로고
    • French, R. H., Sewell, H., Yang, M. K., Peng, S., McCafferty, D., Qiu, W., Wheland, R. C., Lemon, M. F., Markoya, L. and Crawford, M. K., Imaging of 32-nm 1:1 lines and spaces using 193-nm immersion interference lithography with second-generation immersion fluids to achieve a numerical aperture of 1.5 and a kl of 0.25, J. Microlith., Microfab., Microsys. 4(3), 31103-31114 (Jul-Sep 2005).
    • French, R. H., Sewell, H., Yang, M. K., Peng, S., McCafferty, D., Qiu, W., Wheland, R. C., Lemon, M. F., Markoya, L. and Crawford, M. K., "Imaging of 32-nm 1:1 lines and spaces using 193-nm immersion interference lithography with second-generation immersion fluids to achieve a numerical aperture of 1.5 and a kl of 0.25," J. Microlith., Microfab., Microsys. 4(3), 31103-31114 (Jul-Sep 2005).
  • 14
    • 33745772794 scopus 로고    scopus 로고
    • Experimental characterization of the receding meniscus under conditions associated with immersion lithography
    • Shedd, T. A., Schuetter, S. D., Nellis, G. F. and Van Peski, C. K., "Experimental characterization of the receding meniscus under conditions associated with immersion lithography," Proc. SPIE, 6154, 61540R (2006).
    • (2006) Proc. SPIE , vol.6154
    • Shedd, T.A.1    Schuetter, S.D.2    Nellis, G.F.3    Van Peski, C.K.4
  • 17
    • 35648979940 scopus 로고    scopus 로고
    • Contact angles and liquid loss behavior of high index fluids
    • Harder, P. and Shedd, T., "Contact angles and liquid loss behavior of high index fluids," Proc. SPIE, 6533, 653305 (2007).
    • (2007) Proc. SPIE , vol.6533 , pp. 653305
    • Harder, P.1    Shedd, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.