Correlation of frequency shift discontinuity to atomic positions on a Si(111)7×7 surface by noncontact atomic force microscopy

Nanotechnology

Volumn 11, Issue 2, 2000, Pages 120-123

  Morita, Seizo ^a   Sugawara, Yasuhiro ^a   Yokoyama, Kousuke ^a   Uchihashi, Takayuki ^a,b  

^a OSAKA UNIVERSITY   (Japan)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; SEMICONDUCTING SILICON;

NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

NANOSTRUCTURED MATERIALS;

EID: 0033690787     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/11/2/313     Document Type: Article

References (14)

1. Albrecht T R, Grütter P, Horne D and Ruger D 1991 J. Appl. Phys. 69 668
2. Giessibl F J 1995 Science 267 68
3. Kitamura S and Iwatsuki M 1995 Japan. J. Appl. Phys. 34 L145
4. Martin Y, Williams C C and Wickramasinghe H K 1987 J. Appl. Phys. 61 4723
5. Ohnesorge F and Binnig G 1993 Science 260 1451
6. Ohta M, Sugawara Y, Morita S, Nagaoka H, Mishima S and Okada T 1994 J. Vac. Sci. Technol. B 12 1705
7. Ohta M, Sugawara Y, Osaka F, Ohkouchi S, Suzuki M, Mishima S, Okada T and Morita S 1995 J. Vac. Sci. Technol. B 13 1265
8. Pethica J B and Sutton A P 1988 J. Vac. Sci. Technol. A 6 2490
9. Sugawara Y, Ohta M, Hontani K, Morita S, Osaka F, Ohkouchi S, Suzuki M, Nagaoka H, Mishima S and Okada T 1994 Japan. J. Appl. Phys. 33 3739
10. Sugawara Y, Ohta M, Ueyama H and Morita S 1995 Science 270 1646
11. Uchihashi T, Ohta M, Sugawara Y, Yanase Y, Sigematsu T, Suzuki M and Morita S 1997a J. Vac. Sci. Technol. B 15 1543
12. Uchihashi T, Sugawara Y, Tsukamoto T, Ohta M, Morita S and Suzuki M 1997b Phys. Rev. B 56 9834
13. Ueyama H, Ohta M, Sugawara Y and Morita S 1995 Japan. J. Appl. Phys. L 34 1086
14. Ueyama H, Sugawara Y and Morita S 1998 Appl. Phys. A 66 S295