Secondary ion and laser ablation mass spectrometry for the quantitative characterization of styrene-butadiene copolymers

Journal of Mass Spectrometry

Volumn 38, Issue 1, 2003, Pages 50-57

  Ruch, D ^a,b   Muller, J F ^a   Migeon, H N ^b   Boes, C ^c   Zimmer, R ^c  

^a UNIVERSITÉ DE LORRAINE   (France)

^b LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

^c GoodYear Technical Center Luxembourg ^*  (Luxembourg)

Author keywords

Laser ablation mass spectrometry; Quantitative analysis; Secondary ion mass spectrometry; Silver deposition; Styrene butadiene copolymers

Indexed keywords

MONOMERS; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY;

LASER POWER DENSITY;

COPOLYMERS;

1,3 BUTADIENE; CATION; COPOLYMER; MONOMER; POLYSTYRENE; RUBBER; SILVER; STYRENE;

CHEMICAL STRUCTURE; CONTROLLED STUDY; CYCLOTRON; EXCIMER LASER; FOURIER TRANSFORMATION; INTERMETHOD COMPARISON; MASS SPECTROMETER; MASS SPECTROMETRY; MATERIAL COATING; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; REVIEW; THICKNESS; ULTRAVIOLET RADIATION;

EID: 0037261415     PISSN: 10765174     EISSN: None     Source Type: Journal    
DOI: 10.1002/jms.399     Document Type: Review

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