Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 824-827

  Wehbe, Nimer ^a   Delcorte, Arnaud ^a   Heile, Andreas ^b   Arlinghaus, Heinrich F ^b   Bertrand, Patrick ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Atomic projectile; Gold deposition; Polyatomic projectile; Static ToF SIMS; Yield enhancement

Indexed keywords

ATOMS; DEPOSITION; ION SOURCES; PROJECTILES; SECONDARY ION MASS SPECTROMETRY;

ATOMIC PROJECTILE; GOLD DEPOSITION; POLYATOMIC PROJECTILE; STATIC TOF-SIMS; YIELD ENHANCEMENT;

ION BOMBARDMENT;

EID: 56449113653     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.068     Document Type: Article

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