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Volumn 102, Issue 2, 2002, Pages 289-294
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Nanostructure of thin gold films investigated by means of atomic force microscopy and x-ray reflectometry methods
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33748551769
PISSN: 05874246
EISSN: None
Source Type: Journal
DOI: 10.12693/APhysPolA.102.289 Document Type: Conference Paper |
Times cited : (1)
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References (12)
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