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Volumn 102, Issue 2, 2002, Pages 289-294

Nanostructure of thin gold films investigated by means of atomic force microscopy and x-ray reflectometry methods

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Indexed keywords


EID: 33748551769     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.102.289     Document Type: Conference Paper
Times cited : (1)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.