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Volumn 20, Issue 12, 2004, Pages 1623-1628

Molecular weight evaluation of poly(dimethylsiloxane) on solid surfaces using silver deposition/TOF-SIMS

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; ION SOURCES; IONS; MICROCHANNELS; MOLECULAR WEIGHT; SECONDARY ION MASS SPECTROMETRY;

EID: 11244292295     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.20.1623     Document Type: Article
Times cited : (11)

References (29)
  • 27
    • 4143118278 scopus 로고    scopus 로고
    • ed. J. C. Vickerman and D. Briggs, IM Publications and Surface Spectra, Manchester
    • B. Hagenhoff, "TOF-SIMS, Surface Analysis by Mass Spectrometry", ed. J. C. Vickerman and D. Briggs, 2001, IM Publications and Surface Spectra, Manchester, 294.
    • (2001) TOF-SIMS, Surface Analysis by Mass Spectrometry , pp. 294
    • Hagenhoff, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.