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Volumn 203-204, Issue , 2003, Pages 148-151

Enhancement of cluster yield under gold dimer oblique bombardment of the silicon surface

Author keywords

Energy dissipation; Silicon; SIMS; Sputtering

Indexed keywords

COMPUTER SIMULATION; DIMERS; ENERGY DISSIPATION; GOLD; ION BOMBARDMENT; PROBABILITY; SPUTTERING; SUBSTRATES;

EID: 0037438078     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00719-5     Document Type: Conference Paper
Times cited : (7)

References (10)
  • 3
    • 0001426801 scopus 로고    scopus 로고
    • J.C. Vickerman, D. Briggs (Eds.), IM Publications and SurfaceSpectra Limited
    • B.J. Garrison, in: J.C. Vickerman, D. Briggs (Eds.), ToF-SIMS: Surface Analysis by Mass Spectrometry, IM Publications and SurfaceSpectra Limited, 2001, p. 223.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 223
    • Garrison, B.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.