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Volumn 79, Issue 11, 2007, Pages 4126-4134

Time-of-flight secondary ion mass spectrometric analysis of polymer tertiary structure in langmuir monolayer films of poly(dimethylsiloxane)

Author keywords

[No Author keywords available]

Indexed keywords

LANGMUIR MONOLAYER FILMS; POLYMERIC BACKBONE; TERTIARY STRUCTURE;

EID: 34250210560     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac070056c     Document Type: Article
Times cited : (6)

References (24)
  • 1
  • 11
    • 0000290240 scopus 로고    scopus 로고
    • Yan, W.-Y.; Ammon, D. M., Jr.; Gardella, J. A., Jr.; Maziarz, E. P.; Hawkridge, A. M.; Grobe, G. L.; Wood, T. D.Eur. J. Mass Spectrom. 1998, 4, 467-474.
    • Yan, W.-Y.; Ammon, D. M., Jr.; Gardella, J. A., Jr.; Maziarz, E. P.; Hawkridge, A. M.; Grobe, G. L.; Wood, T. D.Eur. J. Mass Spectrom. 1998, 4, 467-474.
  • 13
    • 34250185848 scopus 로고    scopus 로고
    • Reflection-Absorption Fourier Transfrom Infrared Spectroscopic Study of Poly(dimethylsilxoane) Films Transferred using the Langmuir-Blodgett Technique
    • In preparation
    • Piwowar, A.; Gardella, J. A. J. Reflection-Absorption Fourier Transfrom Infrared Spectroscopic Study of Poly(dimethylsilxoane) Films Transferred using the Langmuir-Blodgett Technique. In preparation.
    • Piwowar, A.1    Gardella, J.A.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.