Quantitative analysis of styrene butadiene copolymers using S-SIMS and LA-FTICRMS

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 566-570

  Ruch, D ^a,b   Boes, C ^c   Zimmer, R ^c   Muller, J F ^a   Migeon, H N ^b  

^a Laboratoire d'Analyse Des Materiaux   (Luxembourg)

^b Laboratoire de SMCL   (France)

^c GoodYear Technical Center Luxembourg ^*  (Luxembourg)

Author keywords

Copolymers; LA FTICRMS; Quantification; Silver deposition; SIMS

Indexed keywords

BUTADIENE; COPOLYMERS; CYCLOTRON RESONANCE; DEPOSITION; FOURIER TRANSFORMS; LASER ABLATION; MONOMERS; SECONDARY ION MASS SPECTROMETRY; STYRENE;

STYRENE BUTADIENE COPOLYMERS (SBR);

SURFACE STRUCTURE;

EID: 12244272111     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00760-2     Document Type: Conference Paper

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