Spatial correlation extraction via random field simulation and production chip performance regression

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 527-532

  Liu, Bao ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A-PRIORI; CHIP PERFORMANCE; CRITICAL PATHS; ENGINEERING CHANGE ORDERS; EXTRACTION TECHNIQUES; FAST FOURIER TRANSFORM (FFT); MONTE CARLO; PROCESS VARIATIONS; RANDOM FIELD; RANDOM FIELD SIMULATION; RANDOM VARIATIONS; RANDOM-FIELD MODELS; SIGNAL PROPAGATION; SPATIAL CORRELATION; SPICE SIMULATIONS; STANDARD DEVIATION; STATISTICAL TIMING ANALYSIS;

CORRELATION METHODS; FAST FOURIER TRANSFORMS; FOOD PROCESSING; FOURIER TRANSFORMS; INDUSTRIAL ENGINEERING; INTEGRATED CIRCUIT TESTING; NETWORKS (CIRCUITS); RANDOM PROCESSES; REGRESSION ANALYSIS; SPICE; STANDARDS; STATISTICAL METHODS; STATISTICS; TECHNOLOGY; TESTING; TIME MEASUREMENT; TIMING CIRCUITS;

PROCESS ENGINEERING;

EID: 49749143700     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484904     Document Type: Conference Paper

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