Robust extraction of spatial correlation

Proceedings of the International Symposium on Physical Design

Volumn 2006, Issue , 2006, Pages 2-9

  Xiong, Jinjun ^a   Zolotov, Vladimir ^b   He, Lei ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b IBM RESEARCH   (United States)

Author keywords

Extraction; Process Variation; Robust Extraction; Spatial Correlation

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; EXTRACTION; FUNCTION EVALUATION; MICROPROCESSOR CHIPS; PARAMETER ESTIMATION; PROBLEM SOLVING; STATISTICAL METHODS;

PROCESS VARIATION; RANDOM NOISES; ROBUST EXTRACTION; SPATIAL CORRELATION;

CORRELATION THEORY;

EID: 33745945256     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1123008.1123011     Document Type: Conference Paper

References (16)

1. H. Chang and S. Sapatnekar, "Statistical timing analysis considering spatial correlations using a single PERT-like traversal," in Proc. Int. Conf. on Computer Aided Design, pp. 621 - 625, Nov. 2003.
2. C. Visweswariah, K. Ravindran, K. Kalafala, S. G. Walker, and S. Narayan, "First-order incremental block-based statistical timing analysis," in Proc. Design Automation Conf, June 2004.
3. M. Orshansky and A. Bandyopadhyay, "Fast statistical timing analysis handling arbitrary delay correlations," in DAC 04, June 2004.
4. A. Agarwal, D. Blaauw, and V. Zolotov, "Statistical timing analysis for intra-die process variations with spatial correlations," in Proc. Int. Conf. on Computer Aided Design, pp. 900-907, Nov. 2003.
5. L. Zhang, W. Chen, Y. Hu, J. A. Gubner, and C. C.-P. Chen, "Statistical timing analysis with extended pseudo-canonical timing model," in Proc. Design Automation and Test in Europe, pp. 952-957, March 2005.
6. J. Kibarian and A. Strojwas, "Using spatial information to analyze correlations between test structure data," in Semiconductor Manufacturing, IEEE Transactions on, pp. 219-225, Aug. 1991.
7. P. Mozumder and L. Loewenstein, "Method for semiconductor process optimization using functional representations of spatial variations and selectivity," in Components, Hybrids, and Manufacturing Technology, IEEE Transactions on, pp. 311-316, June 1992.
8. B. Stine, D. Boning, and J. Chung, "Analysis and decomposition of spatial variation in integrated circuit processes and devices," in Semiconductor Manufacturing, IEEE Transactions on, pp. 24-41, Feb. 1997.
9. M. Orshansky, L. Milor, P. Chen, K. Keutzer, and C. Hu, "Impact of spatial intrachip gate length variability on the performance of high-speed digital circuits," in IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, pp. 544-553, May 2002.
10. P. Friedberg, Y. Cao, J. Cain, R. Wang, J. Rabaey, and C. Spanos, "Modeling within-die spatial correlation effects for process-design co-optimization," in Sixth International Symposium on Quality of Electronic Design, pp. 516-521, March 2005.
11. A. Yaglom, "Some classes of random fields in n-diinensional space, related to stationary random processes," in Theory Probability Applications, vol. 2, pp. 273-320, 1957.
12. R. Hogg and E. Tranis, Probability and Statistical Inference, Prentice Hall, 2001.
13. R. L. Bras and I. Rodriguez-Iturbe, Random Functions and Hydrology. Dover Publishers, 1985.
14. T. Coleman and Y. Li, "An interior, trust region approach for nonlinear minimization subject to bounds," in SIAM Journal on Optimization, vol. 6, pp. 418-445, 1996.
15. N. Higham, "Computing the nearest correlation matrix - a problem from finance," in IMA Journal of Numerical Analysis, vol. 22, pp. 329-343, 2002.
16. S. Boyd and L. Xiao, "Least-squares covariance matrix adjustment," in SIAM Journal on Matrix Analysis and Applications, June 2004. in submission.