-
1
-
-
33747435876
-
-
(a) Aswal, D. K.; Lenfant, S.; Guerin, D.; Yakhmi, J. V.; Vuillaume, D. Anal. Chim. Acta 2006, 568, 84-108.
-
(2006)
Anal. Chim. Acta
, vol.568
, pp. 84-108
-
-
Aswal, D.K.1
Lenfant, S.2
Guerin, D.3
Yakhmi, J.V.4
Vuillaume, D.5
-
2
-
-
38749089860
-
-
(b) Sassolas, A.; Leca-Bouvier, B. D.; Blum, L. J. Chem. Rev. 2008, 108, 109-139.
-
(2008)
Chem. Rev
, vol.108
, pp. 109-139
-
-
Sassolas, A.1
Leca-Bouvier, B.D.2
Blum, L.J.3
-
4
-
-
0032021791
-
-
Sieval, A. B.; Demirel, A. L.; Nissink, J. W. M.; Linford, M. R.; Van der Maas, J. H.; De Jeu, W. H.; Zuilhof, H.; Sudhölter, E. J. R. Langmuir 1998, 14, 1759-1768.
-
(1998)
Langmuir
, vol.14
, pp. 1759-1768
-
-
Sieval, A.B.1
Demirel, A.L.2
Nissink, J.W.M.3
Linford, M.R.4
Van der Maas, J.H.5
De Jeu, W.H.6
Zuilhof, H.7
Sudhölter, E.J.R.8
-
5
-
-
0037684770
-
-
(a) Wei, F.; Sun, B.; Liao, W.; Ouyang, J. H.; Zhao, X. S. Biosens. Bioelectron. 2003, 18, 1149-1155.
-
(2003)
Biosens. Bioelectron
, vol.18
, pp. 1149-1155
-
-
Wei, F.1
Sun, B.2
Liao, W.3
Ouyang, J.H.4
Zhao, X.S.5
-
6
-
-
2942644517
-
-
(b) Liao, W.; Wei, F.; Qian, M. X.; Zhao, X. S. Sens. Actuators, B 2004, 101, 361-367.
-
(2004)
Sens. Actuators, B
, vol.101
, pp. 361-367
-
-
Liao, W.1
Wei, F.2
Qian, M.X.3
Zhao, X.S.4
-
7
-
-
33244492627
-
-
(c) Liao, W.; Wei, F.; Liu, D.; Qian, M. X.; Yuan, G.; Zhao, X. S. Sens. Actuators, B 2006, 114, 445-450.
-
(2006)
Sens. Actuators, B
, vol.114
, pp. 445-450
-
-
Liao, W.1
Wei, F.2
Liu, D.3
Qian, M.X.4
Yuan, G.5
Zhao, X.S.6
-
8
-
-
2542467585
-
-
Liu, Y.-J.; Navasero, N. M.; Yu, H. Z. Langmuir 2004, 20, 4039-4050.
-
(2004)
Langmuir
, vol.20
, pp. 4039-4050
-
-
Liu, Y.-J.1
Navasero, N.M.2
Yu, H.Z.3
-
9
-
-
49649124735
-
-
Roughness of surface after indirect attachment of NHS due to adsorption thereof
-
Roughness of surface after indirect attachment of NHS due to adsorption thereof.
-
-
-
-
10
-
-
11144221209
-
-
2 groups in the alkyl chains.
-
2 groups in the alkyl chains.
-
-
-
-
11
-
-
30344434994
-
-
(b) Faucheux, A.; Gouget-Laemmel, A. C.; de Villeneuve, C. H.; Boukherroub, R.; Ozanam, F.; Allongue, P.; Chazalviel, J.-N. Langmuir 2006, 22, 153-162.
-
(2006)
Langmuir
, vol.22
, pp. 153-162
-
-
Faucheux, A.1
Gouget-Laemmel, A.C.2
de Villeneuve, C.H.3
Boukherroub, R.4
Ozanam, F.5
Allongue, P.6
Chazalviel, J.-N.7
-
12
-
-
49649121595
-
-
Personal communication
-
(c) Allongue, P. Personal communication.
-
-
-
Allongue, P.1
-
13
-
-
33846882609
-
-
Mendoza, S. M.; Arfaoui, I.; Zanarini, S.; Paolucci, F.; Rudolf, P. Langmuir 2007, 23, 582-588.
-
(2007)
Langmuir
, vol.23
, pp. 582-588
-
-
Mendoza, S.M.1
Arfaoui, I.2
Zanarini, S.3
Paolucci, F.4
Rudolf, P.5
-
14
-
-
6444242702
-
-
(a) Böcking, T.; James, M.; Coster, H. G. L.; Chilcott, T. C.; Barrow, K. D. Langmuir2004, 20, 9227-9235.
-
(2004)
Langmuir
, vol.20
, pp. 9227-9235
-
-
Böcking, T.1
James, M.2
Coster, H.G.L.3
Chilcott, T.C.4
Barrow, K.D.5
-
15
-
-
0037031429
-
-
(b) Wojtyk, J. T. C.; Morin, K. A.; Boukherroub, R.; Wayner, D. D. M. Langmuir 2002, 18, 6081-6087.
-
(2002)
Langmuir
, vol.18
, pp. 6081-6087
-
-
Wojtyk, J.T.C.1
Morin, K.A.2
Boukherroub, R.3
Wayner, D.D.M.4
-
16
-
-
4043063725
-
-
Yin, H. B.; Brown, T.; Wilkinson, J. S.; Eason, R. W.; Melvin, T. Nucleic Acids Res. 2004, 32, e118.
-
(2004)
Nucleic Acids Res
, vol.32
-
-
Yin, H.B.1
Brown, T.2
Wilkinson, J.S.3
Eason, R.W.4
Melvin, T.5
-
17
-
-
49649117231
-
-
Decomposition percentage of the NHS-ester moieties based on detailed XPS analysis of the C narrow spectrum and C/O ratio in the Supporting Information of ref 9a
-
Decomposition percentage of the NHS-ester moieties based on detailed XPS analysis of the C narrow spectrum and C/O ratio in the Supporting Information of ref 9a.
-
-
-
-
18
-
-
14744269444
-
-
Sun, Q.-Y.; De Smet, L. C. P. M.; Van Lagen, B.; Giesbers, M.; Thüne, P. C.; Van Engelenburg, J.; De Wolf, F. A.; Zuilhof, H.; Sudhölter, E. J. R. J. Am. Chem. Soc. 2005, 127, 2514-2523.
-
(2005)
J. Am. Chem. Soc
, vol.127
, pp. 2514-2523
-
-
Sun, Q.-Y.1
De Smet, L.C.P.M.2
Van Lagen, B.3
Giesbers, M.4
Thüne, P.C.5
Van Engelenburg, J.6
De Wolf, F.A.7
Zuilhof, H.8
Sudhölter, E.J.R.9
-
19
-
-
10744225130
-
-
(a) De Smet, L. C. P. M.; Stork, G. A.; Hurenkamp, G. H. F.; Sun, Q.-Y.; Topal, H.; Vronen, P. J. E.; Sieval, A. B.; Wright, A.; Visser, G. M.; Zuilhof, H.; Sudhölter, E. J. R. J. Am. Chem. Soc. 2003, 125, 13916-13917.
-
(2003)
Am. Chem. Soc
, vol.125
, pp. 13916-13917
-
-
De Smet, L.C.P.M.1
Stork, G.A.2
Hurenkamp, G.H.F.3
Sun, Q.-Y.4
Topal, H.5
Vronen, P.J.E.6
Sieval, A.B.7
Wright, A.8
Visser, G.M.9
Zuilhof, H.10
Sudhölter, E.J.R.J.11
-
20
-
-
3242685571
-
-
(b)Sun, Q.-Y.; de Smet, L. C. P. M.; van Lagen, B.; Wright, A.; Zuilhof, H.; Sudhölter, E. J. R. Angew. Chem., Int. Ed. 2004, 43, 1352-1355.
-
(2004)
Angew. Chem., Int. Ed
, vol.43
, pp. 1352-1355
-
-
Sun, Q.-Y.1
de Smet, L.C.P.M.2
van Lagen, B.3
Wright, A.4
Zuilhof, H.5
Sudhölter, E.J.R.6
-
21
-
-
7944229297
-
-
(c) Eves, B. J.; Sun, Q. Y.; Lopinski, G. P.; Zuilhof, H. J. Am. Chem. Soc. 2004, 126, 14318-14319.
-
(2004)
J. Am. Chem. Soc
, vol.126
, pp. 14318-14319
-
-
Eves, B.J.1
Sun, Q.Y.2
Lopinski, G.P.3
Zuilhof, H.4
-
22
-
-
24644436890
-
-
(d) De Smet, L. C. P. M.; Pukin, A. V.; Sun, Q.-Y.; Eves, B. J.; Lopinski, G. P.; Visser, G. M.; Zuilhof, H.; Sudhölter, E. J. R. Appl. Surf. Sci. 2005, 252, 24-30.
-
(2005)
Appl. Surf. Sci
, vol.252
, pp. 24-30
-
-
De Smet, L.C.P.M.1
Pukin, A.V.2
Sun, Q.-Y.3
Eves, B.J.4
Lopinski, G.P.5
Visser, G.M.6
Zuilhof, H.7
Sudhölter, E.J.R.8
-
23
-
-
34547734540
-
-
(e) Scheres, L.; Arafat, A.; Zuilhof, H. Langmuir 2007, 23, 8343-8346.
-
(2007)
Langmuir
, vol.23
, pp. 8343-8346
-
-
Scheres, L.1
Arafat, A.2
Zuilhof, H.3
-
24
-
-
0033593424
-
-
Macossay, J.; Shamsi, S. A.; Warner, I. M. Tetrahedron Lett. 1999, 40, 577-580.
-
(1999)
Tetrahedron Lett
, vol.40
, pp. 577-580
-
-
Macossay, J.1
Shamsi, S.A.2
Warner, I.M.3
-
25
-
-
49649101953
-
-
Frisch, M. J, Tracks, G. W, Schlegel, H. B, Scuseria, G. E, Robb, M. A, Cheeseman, J. R, Montgomery, J. A, Vreven, T, Kudin, K. N, Burant, J. C, Millam, J. M, Iyengar, S. S, Tomasi, J, Barone, V, Mennucci, B, Cossi, M, Scalmani, G, Rega, N, Petersson, G. A, Nakatsuji, H, Hada, M, Ehara, M, Toyota, K, Fukuda, R, Hasegawa, J, Ishida, M, Nakajima, T, Honda, Y, Kitao, O, Nakai, H, Klene, M, Li, X, Knox, J. E, Hratchian, H. P, Cross, J. B, Bakken, V, Adamo, C, Jaramillo, J, Gomperts, R, Stratmann, R. E, Yazyev, O, Austin, A. J, Cammi, R, Pomelli, C, Ochterski, J. W, Ayala, P. Y, Morokuma, K, Voth, G. A, Salvador, P, Dannenberg, J. J, Zakrzewski, V. G, Dapprich, S, Daniels, A. D, Strain, M. C, Farkas, O, Malick, D. K, Rabuck, A. D, Raghavachari, K, Foresman, J. B, Ortiz, J. V, Cui, Q, Baboul, A. G, Clifford, S, Cioslowski, J, Stefanov, B. B, Liu, G, Liashenko, A, Piskorz, P, Komaromi, I, Martin, R. L, Fox, D. J, Keith, T
-
Frisch, M. J.; Tracks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Montgomery, J. A.; Vreven, T.; Kudin, K. N.; Burant, J. C.; Millam, J. M.; Iyengar, S. S.; Tomasi, J.; Barone, V.; Mennucci, B.; Cossi, M.; Scalmani, G.; Rega, N.; Petersson, G. A.; Nakatsuji, H.; Hada, M.; Ehara, M.; Toyota, K.; Fukuda, R.; Hasegawa, J.; Ishida, M.; Nakajima, T.; Honda, Y.; Kitao, O.; Nakai, H.; Klene, M.; Li, X.; Knox, J. E.; Hratchian, H. P.; Cross, J. B.; Bakken, V.; Adamo, C.; Jaramillo, J.; Gomperts, R.; Stratmann, R. E.; Yazyev, O.; Austin, A. J.; Cammi, R.; Pomelli, C.; Ochterski, J. W.; Ayala, P. Y.; Morokuma, K.; Voth, G. A.; Salvador, P.; Dannenberg, J. J.; Zakrzewski, V. G.; Dapprich, S.; Daniels, A. D.; Strain, M. C.; Farkas, O.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Ortiz, J. V.; Cui, Q.; Baboul, A. G.; Clifford, S.; Cioslowski, J.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Challacombe, M.; Gill, P. M. W.; Johnson, B.; Chen, W.; Wong, M. W.; Gonzalez, C.; Pople, J. A. Gaussian03, revision D.01; Gaussian, Inc.: Wallingford, CT, 2004.
-
-
-
-
26
-
-
49649120759
-
-
Glendening, E. D, Reed, A. E, Carpenter, J. E, Weinhold, F. NBO, version 3.1
-
Glendening, E. D.; Reed, A. E.; Carpenter, J. E.; Weinhold, F. NBO, version 3.1.
-
-
-
-
27
-
-
27744579674
-
-
(a) Guo, D.-J.; Xiao, S.J.; Xia, B.; Wei, S.; Pei, J.; Pan, Y.; You, X.-Z.; Gu, Z.-Z.; Lu, Z. J. Phys. Chem. B 2005, 109, 20620-20628.
-
(2005)
Phys. Chem. B
, vol.109
, pp. 20620-20628
-
-
Guo, D.-J.1
Xiao, S.J.2
Xia, B.3
Wei, S.4
Pei, J.5
Pan, Y.6
You, X.-Z.7
Gu, Z.-Z.8
Lu, Z.J.9
-
28
-
-
0034663267
-
-
(b) Duhachek, S. D.; Kenseth, J. R.; Casale, G. P.; Small, G. J.; Porter, M. D.; Jankowiak, R. Anal. Chem. 2000, 72, 3709-3716.
-
(2000)
Anal. Chem
, vol.72
, pp. 3709-3716
-
-
Duhachek, S.D.1
Kenseth, J.R.2
Casale, G.P.3
Small, G.J.4
Porter, M.D.5
Jankowiak, R.6
-
29
-
-
5244297041
-
-
(a) Snyder, R. G.; Strauss, H. L.; Elliger, C. A. J. Phys. Chem. 1982, 86, 5145-5150.
-
(1982)
J. Phys. Chem
, vol.86
, pp. 5145-5150
-
-
Snyder, R.G.1
Strauss, H.L.2
Elliger, C.A.3
-
30
-
-
0006163257
-
-
(b) Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559-3568.
-
(1987)
J. Am. Chem. Soc
, vol.109
, pp. 3559-3568
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
31
-
-
19744366928
-
-
As observable with our XPS set-up. See for highly detailed other XPS analyses of organic monolayers on silicon: (a) Wallart, X.; de Villeneuve, C. H.; Allongue,P. J. Am. Chem. Soc. 2005, 127, 7871-7878.
-
As observable with our XPS set-up. See for highly detailed other XPS analyses of organic monolayers on silicon: (a) Wallart, X.; de Villeneuve, C. H.; Allongue,P. J. Am. Chem. Soc. 2005, 127, 7871-7878.
-
-
-
-
32
-
-
15544375465
-
-
(b) Webb, L. J.; Nemanick, E. J.; Biteen, J. S.; Knapp, D. W.; Michalak, D. J.; Traub, M. C.; Chan, A. S. Y.; Brunschwig, B. S.; Lewis, N. S. J. Phys. Chem. B 2005, 109, 3930-3937.
-
(2005)
J. Phys. Chem. B
, vol.109
, pp. 3930-3937
-
-
Webb, L.J.1
Nemanick, E.J.2
Biteen, J.S.3
Knapp, D.W.4
Michalak, D.J.5
Traub, M.C.6
Chan, A.S.Y.7
Brunschwig, B.S.8
Lewis, N.S.9
-
33
-
-
33846101601
-
-
(c) Webb, L. J.; Michalak, D. J.; Biteen, J. S.; Brunschwig, B. S.; Chan, A. S. Y.; Knapp, D. W.; Meyer, H. M., III; Nemanick, E. J.; Traub, M. C.; Lewis, N. S. J. Phys. Chem. B 2006, 110, 23450-23459.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 23450-23459
-
-
Webb, L.J.1
Michalak, D.J.2
Biteen, J.S.3
Brunschwig, B.S.4
Chan, A.S.Y.5
Knapp, D.W.6
Meyer III, H.M.7
Nemanick, E.J.8
Traub, M.C.9
Lewis, N.S.10
-
34
-
-
3042631462
-
-
Brigss, D, Grant, J. T, Eds, IM Publications: Chichester, U.K
-
(20)Brigss, D.; Grant, J. T., Eds.; Surface Analysis by Auger and X-ray Photoelectron Spectroscopy; IM Publications: Chichester, U.K., 2003.
-
(2003)
Surface Analysis by Auger and X-ray Photoelectron Spectroscopy
-
-
-
36
-
-
38549104119
-
-
Tielens, F.; Costa, D.; Humblot, V.; Pradier, C. M. J. Phys. Chem. C 2008, 112, 182-190.
-
(2008)
J. Phys. Chem. C
, vol.112
, pp. 182-190
-
-
Tielens, F.1
Costa, D.2
Humblot, V.3
Pradier, C.M.4
-
37
-
-
18044398972
-
-
Love, J. C.; Estroff, L. A.; Kriebel, J. K.; Nuzzo, R. G.; Whitesides, G. M. Chem. Rev. 2005, 105, 1103-1169.
-
(2005)
Chem. Rev
, vol.105
, pp. 1103-1169
-
-
Love, J.C.1
Estroff, L.A.2
Kriebel, J.K.3
Nuzzo, R.G.4
Whitesides, G.M.5
-
38
-
-
26844451426
-
-
Onclin, S.; Ravoo, B. J.; Reinhoudt, D. N. Angew. Chem., Int. Ed. 2005, 44, 6282-6304.
-
(2005)
Angew. Chem., Int. Ed
, vol.44
, pp. 6282-6304
-
-
Onclin, S.1
Ravoo, B.J.2
Reinhoudt, D.N.3
-
39
-
-
3242698573
-
-
(a) Arafat, A.; Schroën, K.; de Smet, L. C. P. M.; Sudhölter, E. J. R.; Zuilhof, H. J. Am. Chem. Soc. 2004, 126, 8600-8601.
-
(2004)
J. Am. Chem. Soc
, vol.126
, pp. 8600-8601
-
-
Arafat, A.1
Schroën, K.2
de Smet, L.C.P.M.3
Sudhölter, E.J.R.4
Zuilhof, H.5
-
40
-
-
34249874017
-
-
(b) Arafat, A.; Giesbers, M.; Rosso, M.; Sudhölter, E. J. R.; Schroën, K.; White, R. G.; Yang, L.; Linford, M. R.; Zuilhof, H. Langmuir 2007, 23, 6233-6244.
-
(2007)
Langmuir
, vol.23
, pp. 6233-6244
-
-
Arafat, A.1
Giesbers, M.2
Rosso, M.3
Sudhölter, E.J.R.4
Schroën, K.5
White, R.G.6
Yang, L.7
Linford, M.R.8
Zuilhof, H.9
-
41
-
-
42449141952
-
-
Rosso, M.; Arafat, A.; Schroën, K.; Giesbers, M.; Roper, C. S.; Maboudian, R.; Zuilhof, H. Langmuir 2008, 24, 4007-4012.
-
(2008)
Langmuir
, vol.24
, pp. 4007-4012
-
-
Rosso, M.1
Arafat, A.2
Schroën, K.3
Giesbers, M.4
Roper, C.S.5
Maboudian, R.6
Zuilhof, H.7
|