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Volumn 24, Issue 15, 2008, Pages 7931-7938

One-step photochemical attachment of NHS-terminated monolayers onto silicon surfaces and subsequent functionalization

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; AMINATION; AMINES; ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; CONTACT ANGLE; DENSITY FUNCTIONAL THEORY; ELECTRON ENERGY LEVELS; ESTERIFICATION; ESTERS; HYDROCARBONS; IMAGING TECHNIQUES; INFRARED SPECTROSCOPY; MICROSCOPIC EXAMINATION; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; MONOLAYERS; NANOFLUIDICS; NANOSTRUCTURED MATERIALS; NONMETALS; OLEFINS; ORGANIC COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PROBABILITY DENSITY FUNCTION; SCANNING PROBE MICROSCOPY; SILICON; SURFACE REACTIONS;

EID: 49649125919     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la800462u     Document Type: Article
Times cited : (74)

References (42)
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    • Roughness of surface after indirect attachment of NHS due to adsorption thereof
    • Roughness of surface after indirect attachment of NHS due to adsorption thereof.
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    • 2 groups in the alkyl chains.
    • 2 groups in the alkyl chains.
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    • Personal communication
    • (c) Allongue, P. Personal communication.
    • Allongue, P.1
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    • Decomposition percentage of the NHS-ester moieties based on detailed XPS analysis of the C narrow spectrum and C/O ratio in the Supporting Information of ref 9a
    • Decomposition percentage of the NHS-ester moieties based on detailed XPS analysis of the C narrow spectrum and C/O ratio in the Supporting Information of ref 9a.
  • 25
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    • Frisch, M. J, Tracks, G. W, Schlegel, H. B, Scuseria, G. E, Robb, M. A, Cheeseman, J. R, Montgomery, J. A, Vreven, T, Kudin, K. N, Burant, J. C, Millam, J. M, Iyengar, S. S, Tomasi, J, Barone, V, Mennucci, B, Cossi, M, Scalmani, G, Rega, N, Petersson, G. A, Nakatsuji, H, Hada, M, Ehara, M, Toyota, K, Fukuda, R, Hasegawa, J, Ishida, M, Nakajima, T, Honda, Y, Kitao, O, Nakai, H, Klene, M, Li, X, Knox, J. E, Hratchian, H. P, Cross, J. B, Bakken, V, Adamo, C, Jaramillo, J, Gomperts, R, Stratmann, R. E, Yazyev, O, Austin, A. J, Cammi, R, Pomelli, C, Ochterski, J. W, Ayala, P. Y, Morokuma, K, Voth, G. A, Salvador, P, Dannenberg, J. J, Zakrzewski, V. G, Dapprich, S, Daniels, A. D, Strain, M. C, Farkas, O, Malick, D. K, Rabuck, A. D, Raghavachari, K, Foresman, J. B, Ortiz, J. V, Cui, Q, Baboul, A. G, Clifford, S, Cioslowski, J, Stefanov, B. B, Liu, G, Liashenko, A, Piskorz, P, Komaromi, I, Martin, R. L, Fox, D. J, Keith, T
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    • Glendening, E. D, Reed, A. E, Carpenter, J. E, Weinhold, F. NBO, version 3.1
    • Glendening, E. D.; Reed, A. E.; Carpenter, J. E.; Weinhold, F. NBO, version 3.1.
  • 31
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    • As observable with our XPS set-up. See for highly detailed other XPS analyses of organic monolayers on silicon: (a) Wallart, X.; de Villeneuve, C. H.; Allongue,P. J. Am. Chem. Soc. 2005, 127, 7871-7878.
    • As observable with our XPS set-up. See for highly detailed other XPS analyses of organic monolayers on silicon: (a) Wallart, X.; de Villeneuve, C. H.; Allongue,P. J. Am. Chem. Soc. 2005, 127, 7871-7878.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.