Photochemical attachment of organic monolayers onto H-terminated Si(111): Radical chain propagation observed via STM studies

Journal of the American Chemical Society

Volumn 126, Issue 44, 2004, Pages 14318-14319

  Eves, Brian J ^b   Sun, Qiao Yu ^a   Lopinski, Gregory P ^b   Zuilhof, Han ^a  

^a WAGENINGEN UNIVERSITY   (Netherlands)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; ORGANIC COMPOUND; SILICON; STYRENE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL BOND; CHEMICAL INTERACTION; CHEMICAL REACTION; CHEMICAL STRUCTURE; COVALENT BOND; DENSITY; DISSOCIATION; GEOMETRY; HEATING; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; HYDROGENATION; IMAGE ANALYSIS; MEASUREMENT; PHOTOCHEMISTRY; REACTION ANALYSIS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; SYNTHESIS; TECHNIQUE; TEMPERATURE DEPENDENCE; ULTRAVIOLET IRRADIATION; VACUUM;

EID: 7944229297     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja045777x     Document Type: Article

References (22)

1. (a) Sieval, A. B.; Linke, R.; Zuilhof, H.; Sudhölter, E. J. R. Adv. Mater. 2000, 12, 1457.
2. (b) Buriak, J. M. Chem. Rev. 2002, 102, 1271.
3. (c) Wayner, D. D. M.; Wolkow, R. A. J. Chem. Soc., Perkin Trans 2 2002, 23.
4. (a) Salting from simple transesterifications in ref 2b to much more complicated transformations, see ref 1b.
5. (b) Sieval, A. B.; Demirel, A. L.; Nissink, J. W. M.; Linford, M. R.; van der Maas, J. H.; de Jeu, W. H.; Zuilhof, H.; Sudhölter, E. J. R. Langmuir 1998, 14, 1759.
6. (a) Lin, Z.; Strother, T.; Cai, W.; Cao, X. P.; Smith, L. M.; Hamers, R. J. Langmuir 2002, 18, 788.
7. (b) Strother, T.; Cai, W.; Zhao, X. S.; Hamers, R. J.; Smith, L. M. J. Am. Chem. Soc. 2000, 122, 1205.
8. (c) Pike, A. R.; Lie, L. H.; Eagling, R. A.; Ryder, L. C.; Patole, S. N.; Connolly, B. A.; Horrocks, B. R.; Houlton, A. Angew. Chem., Int. Ed. 2002, 41, 615.
9. (a) Link, J. R.; Sailor, M. J. Proc. Natl. Acad. Sci. U.S.A. 2003, 100, 10607.
10. (b) O, B. H.; Liu, R. Li, Y. Y.; Sailor, M. J. Fainman, Y. IEEE Photonics Technol. Lett. 2003, 15, 834.
11. Sun, Q.-Y.; de Smet, L. C. P. M.; Van Lagen, B.; Wright, A.; Zuilhof, H.; Sudhölter, E. J. R. Angew. Chem., Int. Ed. 2004, 43, 1352.
12. de Smet, L. C. P. M.; Stork, G. A.; Hurenkamp, G. H. F.; Sun, Q.-Y.; Topal, H.; Vronen, P. J. E.; Sieval, A. B.; Wright, A.; Visser, G. M.; Zuilhof, H.; Sudhölter, E. J. R. J. Am. Chem. Soc. 2003, 125, 13916.
13. Stewart, M. P.; Buriak, J. M. J. Am. Chem. Soc. 2001, 123, 7821.
14. Cai, W.; Lin, Z.; Strother, T.; Smith, L. M.; Hamers, R. J. J. Phys. Chem. B 2002, 106, 2656.
15. Lopinski, G. P.; Wayner, D. D. M.; Wolkow, R. A. Nature 2000, 406, 48.
16. Cicero, R. L.; Chidsey, C. E. D.; Lopinski, G. P.; Wayner, D. D. M.; Wolkow, R. A. Langmuir 2002, 18, 305.
17. Cicero, R. L.; Linford, M. R.; Chidsey, C. E. D. Langmuir 2000, 16, 5688.
18. This is due to the combination of a decreasing number of Si-H bonds on the surface, and a reduction of their impact scattering intensity due to the growth of the organic monolayer.
19. (a) Sung, M. M.; Kluth, G. J.; Yauw, O. W.; Maboudian, R. Langmuir 1997, 13, 6164.
20. (b) Kluth, G. J.; Carraro, C.; Maboudian, R. Phys. Rev. B 1999, 59, R10449.
21. Effenberger, F.; Gotz, G.; Bidlingmaier, B. Wezstein, M. Angew. Chem., Int. Ed. Engl. 1998, 37, 2462.
22. Sun, Q.-Y.; de Smet, L. C. P. M.; Van Lagen, B.; Zuilhof, H.; Sudhölter, E. J. R. Unpublished data.